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Total Ionizing Dose Responses of Forward Body Bias Ultra-Thin Body and Buried Oxide FD-SOI Transistors 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2019, 卷号: 66, 期号: 4, 页码: 702-709
作者:  Zheng, QW (Zheng, Qiwen)[ 1 ];  Cui, JW (Cui, Jiangwei)[ 1 ];  Xu, LW (Xu, Liewei)[ 2 ];  Ning, BX (Ning, Bingxu)[ 3 ];  Zhao, K (Zhao, Kai)[ 3 ]
收藏  |  浏览/下载：99/0  |  提交时间：2019/05/14
Oxygen Adsorption Effect of Amorphous InGaZnO Thin-Film Transistors 期刊论文
IEEE ELECTRON DEVICE LETTERS, 2017
Zhou, Xiaoliang; Shao, Yang; Zhang, Letao; Xiao, Xiang; Han, Dedong; Wang, Yi; Zhang, Shengdong
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
Indium-Tin-Oxide Thin-Film Transistors With In Situ Anodized Ta2O5 Passivation Layer 期刊论文
IEEE ELECTRON DEVICE LETTERS, 2016
Le, Yong; Shao, Yang; Xiao, Xiang; Xu, Xin; Zhang, Shengdong
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
Investigation into sand mura effects of a-IGZO TFT LCDs 期刊论文
MICROELECTRONICS RELIABILITY, 2016
Liu, Xiang; Hu, Hehe; Ning, Ce; Shang, Guangliang; Yang, Wei; Wang, Ke; Lu, Xinhong; Lee, Woobong; Wang, Gang; Xue, Jianshe; Jun, Jung Mok; Zhang, Shengdong
收藏  |  浏览/下载：7/0  |  提交时间：2017/12/03
Low Power High Performance FinFET Standard Cells Based on Mixed Back Biasing Technology 期刊论文
IEICE TRANSACTIONS ON ELECTRONICS, 2016
Wang, Tian; Cui, Xiaoxin; Liao, Kai; Liao, Nan; Cui, Xiaole; Yu, Dunshan
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/04
Back Channel Anodization Amorphous Indium Gallium Zinc Oxide Thin-Film Transistors Process 期刊论文
ieee electron device letters, 2015
Xiao, Xiang; Shao, Yang; He, Xin; Deng, Wei; Zhang, Letao; Zhang, Shengdong
收藏  |  浏览/下载：4/0  |  提交时间：2015/11/11
Performance and Stability Improvements of Back-Channel-Etched Amorphous Indium-Gallium-Zinc Thin-Film-Transistors by CF4+O-2 Plasma Treatment 期刊论文
IEEE ELECTRON DEVICE LETTERS, 2015
Liu, Xiang; Wang, Lisa Ling; Hu, Hehe; Lu, Xinhong; Wang, Ke; Wang, Gang; Zhang, Shengdong
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
Single-ZnO-Nanobelt-Based Single-Electron Transistors 期刊论文
CHINESE PHYSICS LETTERS, 2014, 卷号: 31, 期号: 6
Ji, XF; Xu, Z; Cao, S; Qiu, KS; Tang, J; Zhang, XT; Xu, XL
收藏  |  浏览/下载：42/0  |  提交时间：2015/04/14
Impacts of Back Gate Bias Stressing on Device Characteristics for Extremely Thin SOI (ETSOI) MOSFETs 期刊论文
IEEE Electron device letters, 2014
作者:  Yan J(闫江);  Tang ZY(唐兆云);  Tang B(唐波);  Zhao LC(赵利川);  Zhao C(赵超)
收藏  |  浏览/下载：8/0  |  提交时间：2015/04/24
Back-Gate Bias Dependence of the Statistical Variability of FDSOI MOSFETs With Thin BOX 期刊论文
ieee电子器件汇刊, 2013
Yang, Yunxiang; Markov, Stanislav; Cheng, Binjie; Zain, Anis Suhaila Mohd; Liu, Xiaoyan; Asenov, Asen
收藏  |  浏览/下载：4/0  |  提交时间：2015/11/13

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