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Modeling the threshold voltage variation induced by channel random dopant fluctuation in fully depleted silicon-on-insulator MOSFETs 期刊论文
JAPANESE JOURNAL OF APPLIED PHYSICS, 2018, 卷号: 57
作者:  Zhang, Guohe;  Yang, Jiangjiang;  Jiang, Peilin;  Bu, Jianhui;  Li, Binhong
收藏  |  浏览/下载：2/0  |  提交时间：2019/11/19
Influence of Dopants Profile on Random Dopant Fluctuation and Optimization for Bulk FinFET 期刊论文
ECS Journal of Solid State Science and Technology, 2017
作者:  Wan GX(万光星);  Zhu HL(朱慧珑)
收藏  |  浏览/下载：16/0  |  提交时间：2018/07/09
New Understanding of Random Telegraph Noise Amplitude in Tunnel FETs 期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2017
Chen, Cheng; Huang, Qianqian; Zhu, Jiadi; Zhao, Yang; Guo, Lingyi; Huang, Ru
收藏  |  浏览/下载：9/0  |  提交时间：2017/12/03
A Device-Level Characterization Approach to Quantify the Impacts of Different Random Variation Sources in FinFET Technology 期刊论文
IEEE ELECTRON DEVICE LETTERS, 2016
Jiang, Xiaobo; Guo, Shaofeng; Wang, Runsheng; Wang, Xingsheng; Cheng, Binjie; Asenov, Asen; Huang, Ru
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/04
Experimental study on the oxide trap coupling effect in metal oxide semiconductor field effect transistors with HfO2 gate dielectrics 期刊论文
应用物理学快报, 2014
Ren, Pengpeng; Wang, Runsheng; Jiang, Xiaobo; Qiu, Yingxin; Liu, Changze; Huang, Ru
收藏  |  浏览/下载：6/0  |  提交时间：2015/11/10
Impact of Random Interface Traps and Random Dopants in High-k/Metal Gate Junctionless FETs 期刊论文
ieee 纳米技术汇刊, 2014
Wang, Yijiao; Huang, Peng; Wei, Kangliang; Zeng, Lang; Liu, Xiaoyan; Du, Gang; Zhang, Xing; Kang, Jinfeng
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/10
Impact of random discrete dopant in extension induced fluctuation in gate-source/drain underlap FinFET 期刊论文
日本应用物理学杂志, 2014
Wang, Yijiao; Huang, Peng; Xin, Zheng; Zeng, Lang; Liu, Xiaoyan; Du, Gang; Kang, Jinfeng
收藏  |  浏览/下载：1/0  |  提交时间：2015/11/10
Impact of random discrete dopant in extension induced fluctuation in gate-source/drain underlap FinFET 其他
2014-01-01
Wang, Yijiao; Huang, Peng; Xin, Zheng; Zeng, Lang; Liu, Xiaoyan; Du, Gang; Kang, Jinfeng
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
Impact of Junction Nonabruptness on Random-Discrete-Dopant Induced Variability in Intrinsic Channel Trigate Metal-Oxide-Semiconductor Field-Effect Transistors 期刊论文
日本应用物理学杂志, 2013
Wei, Kang Liang; Liu, Xiao Yan; Du, Gang
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/13
Back-Gate Bias Dependence of the Statistical Variability of FDSOI MOSFETs With Thin BOX 期刊论文
ieee电子器件汇刊, 2013
Yang, Yunxiang; Markov, Stanislav; Cheng, Binjie; Zain, Anis Suhaila Mohd; Liu, Xiaoyan; Asenov, Asen
收藏  |  浏览/下载：4/0  |  提交时间：2015/11/13

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