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浏览/检索结果: 共10条，第1-10条 帮助 限定条件 专题：光电技术研究所    第一署名单位    第一作者单位    通讯作者单位    发表日期：2016     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 The method to reduce the spinal error in the aspheric mirror testing with the CGH 期刊论文 Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technology: Optical Test, Measurement Technology, and Equipment, 2016, 卷号: 9684, 页码: 968424 作者:  Yan, Fengtao;  Fan, Bin;  Hou, Xi;  Lei, Baiping;  Liu, Haitao 收藏  |  浏览/下载：21/0  |  提交时间：2018/06/14 Aspherics  Computer Generated Holography  Computer Testing  Diffraction  Errors  Interferometry  Manufacture  Mirrors  Surface Measurement   Solving surface parameters of conic asphere mirror based on computer simulation 期刊论文 Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technology: Optical Test, Measurement Technology, and Equipment, 2016, 卷号: 9684, 页码: 96843V 作者:  Huang, Chuan-Ke;  Wu, Yong-Qian;  Fan, Bin;  Lei, Bai-Ping 收藏  |  浏览/下载：23/0  |  提交时间：2018/06/14 Aspherics  Manufacture  Mirrors  Singular Value Decomposition   Evaluating surface repeatability for interferometric measurement: A comparative study 期刊论文 Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technology: Optical Test, Measurement Technology, and Equipment, 2016, 卷号: 9684, 页码: 96842M 作者:  Quan, Haiyang;  Xi, Hou;  Fan, Wu 收藏  |  浏览/下载：8/0  |  提交时间：2018/06/14 Manufacture  Optical Testing  Pixels  Statistics  Uncertainty Analysis   Analysis of absolute flatness testing in sub-stitching interferometer 期刊论文 Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technology: Optical Test, Measurement Technology, and Equipment, 2016, 卷号: 9684, 页码: 968438 作者:  Jia, Xin;  Xu, Fuchao;  Xie, Weimin;  Xing, Tingwen 收藏  |  浏览/下载：20/0  |  提交时间：2018/06/14 Atmospheric Pressure  Clean Rooms  Errors  Humidity Control  Interferometers  Manufacture  Measurements  Optical Testing   Large-scale absolute surface reconstruction 期刊论文 Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technology: Optical Test, Measurement Technology, and Equipment, 2016, 卷号: 9684, 页码: 96843L 作者:  Wu, Gao-Feng;  Quan, Hai-Yang;  Song, Wei-Hong;  Wu, Yong-Qian 收藏  |  浏览/下载：14/0  |  提交时间：2018/06/14 Image Resolution  Interferometry  Inverse Problems  Iterative Methods  Manufacture  Optical Testing  Pixels   Iterative surface construction for blind deflectometry 期刊论文 Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technology: Optical Test, Measurement Technology, and Equipment, 2016, 卷号: 9684, 页码: 96843X 作者:  Zhao, Wenchuan;  Graves, Logan R.;  Huang, Run;  Song, Weihong;  Kim, Daewook 收藏  |  浏览/下载：17/0  |  提交时间：2018/06/14 Data Handling  Iterative Methods  Manufacture  Measurements  Optical Testing  Surface Measurement   A surface irregularity compensation alignment method for all-reflective optical system 期刊论文 Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technology: Optical Test, Measurement Technology, and Equipment, 2016, 卷号: 9684, 页码: 968431 作者:  Li, Lian;  Zhang, Ming;  Ma, Tianmeng 收藏  |  浏览/下载：15/0  |  提交时间：2018/06/14 Alignment  Image Quality  Manufacture  Mirrors  Numerical Methods  Optical Testing   Detection for flatness of large surface based on structured light 期刊论文 Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technology: Optical Test, Measurement Technology, and Equipment, 2016, 卷号: 9684, 页码: 96841W 作者:  He, Wenyan;  Cao, Xuedong;  Long, Kuang;  Peng, Zhang 收藏  |  浏览/下载：18/0  |  提交时间：2018/06/14 Imaging Systems  Manufacture  Pixels   Topography measurement of micro structure by modulation-based method 期刊论文 Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems; and Smart Structures and Materials, 2016, 卷号: 9685, 页码: 968505 作者:  Zhou, Yi;  Tang, Yan;  Liu, Junbo;  Deng, Qinyuan;  Cheng, Yiguang 收藏  |  浏览/下载：19/0  |  提交时间：2018/06/14 Interferometry  Light Sources  Manufacture  Materials Testing  Microstructure  Optical Devices  Pixels  Surface Measurement  Topography   Thickness measurement of transparent film by white-light interferometry 期刊论文 Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems; and Smart Structures and Materials, 2016, 卷号: 9685, 页码: 968506 作者:  Deng, Qinyuan;  Zhou, Yi;  Liu, Junbo;  Yao, Jingwei;  Hu, Song 收藏  |  浏览/下载：24/0  |  提交时间：2018/06/14 Film Thickness  Manufacture  Materials Testing  Optical Devices  Optical Films  Reflection  Reflectometers  Structural Design  Thickness Gages  Thickness Measurement  Thin Films