CORC

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CORC

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Impacts of carbon ions on SEU in SOI SRAM 期刊论文
MICROELECTRONICS RELIABILITY, 2021, 卷号: 126, 页码: 6
作者:  Gao, J.;  Zhang, Q.;  Xi, K.;  Li, B.;  Wang, C.
收藏  |  浏览/下载：25/0  |  提交时间：2022/01/24
SEE  SEU  SOI SRAM  C  
Measurement and evaluation of the Single Event Effects of high-performance SerDes circuits 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2021, 卷号: 1012, 页码: 11
作者:  Wang, Shu;  Cai, Chang;  Ning, Bingxu;  He, Ze;  Huang, Zhiqin
收藏  |  浏览/下载：18/0  |  提交时间：2021/12/08
CIS单粒子效应机理及模拟试验方法 学位论文
中国科学院新疆理化技术研究所: 中国科学院大学, 2021
作者:  蔡毓龙
收藏  |  浏览/下载：41/0  |  提交时间：2021/08/27
Heavy ion track straggling effect in single event effect numerical simulation of 3D stacked devices 期刊论文
MICROELECTRONICS RELIABILITY, 2020, 卷号: 114, 页码: 10
作者:  Liu, T. Q.;  Li, D. Q.;  Cai, C.;  Zhao, P. X.;  Shen, C.
收藏  |  浏览/下载：9/0  |  提交时间：2021/12/13
SEE Sensitivity Evaluation for Commercial 16 nm SRAM-FPGA 期刊论文
ELECTRONICS, 2019, 卷号: 8, 期号: 12, 页码: 12
作者:  Cai, Chang;  Gao, Shuai;  Zhao, Peixiong;  Yu, Jian;  Zhao, Kai
收藏  |  浏览/下载：38/0  |  提交时间：2022/01/19
Preliminary single event effect distribution investigation on 28 nm soc using heavy ion microbeam 期刊论文
Nuclear instruments & methods in physics research section b-beam interactions with materials and atoms, 2019, 卷号: 450, 页码: 323-326
作者:  Yang, Weitao;  Du, Xuecheng;  Guo, Jinlong;  Wei, Junze;  Du, Guanghua
收藏  |  浏览/下载：113/0  |  提交时间：2019/10/08
Preliminary single event effect distribution investigation on 28 nm SoC using heavy ion microbeam 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2019, 卷号: 450, 页码: 323-326
作者:  Yang, Weitao;  Du, Xuecheng;  Guo, Jinlong;  Wei, Junze;  Du, Guanghua
收藏  |  浏览/下载：72/0  |  提交时间：2019/11/10
Effects of total ionizing dose on single event effect sensitivity of FRAMs 期刊论文
MICROELECTRONICS RELIABILITY, 2019, 卷号: 95, 页码: 1-7
作者:  Ji, Qinggang;  Liu, Jie;  Li, Dongqing;  Liu, Tianqi;  Ye, Bing
收藏  |  浏览/下载：54/0  |  提交时间：2019/11/10
Heavy ion-induced single event effects in active pixel sensor array 期刊论文
SOLID-STATE ELECTRONICS, 2019, 卷号: 152, 期号: 2, 页码: 93-99
作者:  Cai, YL (Cai, Yu-Long)[ 1,2,3 ];  Guo, Q (Guo, Qi)[ 1,2 ];  Li, YD (Li, Yu-Dong)[ 1,2 ];  Wen, L (Wen, Lin)[ 1,2 ];  Zhou, D (Zhou, Dong)[ 1,2 ]
收藏  |  浏览/下载：127/0  |  提交时间：2019/01/03

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