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Positive Shift in Threshold Voltage Induced by CuO and NiOx Gate in AlGaN/GaN HEMTs 期刊论文
IEEE Transactions on Electron Devices, 2017, 卷号: Vol.64 No.8, 页码: 3139-3144
作者:  Li, Y;  Guo, YX;  Zhang, K;  Zou, XM;  Wang, JL
收藏  |  浏览/下载:4/0  |  提交时间:2019/12/31
Positive Shift in Threshold Voltage Induced by CuO and NiOₓ Gate in AlGaN/GaN HEMTs 期刊论文
IEEE Transactions on Electron Devices, 2017, 页码: 1-6
作者:  Yi Li;  Yaxiong Guo;  Kai Zhang;  Xuming Zou;  Jingli Wang
收藏  |  浏览/下载:15/0  |  提交时间:2019/12/31
Low Leakage Current and High-Cutoff Frequency AlGaN/GaN MOSHEMT Using Submicrometer-Footprint Thermal Oxidized TiO2/NiO as Gate Dielectric 期刊论文
IEEE ELECTRON DEVICE LETTERS, 2013, 卷号: 34, 期号: 6, 页码: 738-740
作者:  Zhang, YH(张耀辉)
收藏  |  浏览/下载:18/0  |  提交时间:2014/01/15
Low Leakage Current and High-Cutoff Frequency AlGaN/GaN MOSHEMT Using Submicrometer-Footprint Thermal Oxidized TiO2/NiO as Gate Dielectric 期刊论文
ieee electron device letters, 2013
Meng, Di; Lin, Shuxun; Wen, Cheng P.; Wang, Maojun; Wang, Jinyan; Hao, Yilong; Zhang, Yaohui; Lau, Kei May; Wu, Wengang
收藏  |  浏览/下载:3/0  |  提交时间:2015/11/10
Characteristics of submicron-footprint TiO2 based AlGaN/GaN MOSHEMT on SiC substrate 其他
2013-01-01
Di, Meng; Lin, Shuxun; Wen, Cheng P.; Wang, Maojun; Wang, Jinyan; Hao, Yilong; Zhang, Yaohui; Lau, Kei May; Wu, Wengang
收藏  |  浏览/下载:4/0  |  提交时间:2015/11/13
高介电栅介质材料HfO2掺杂后的物理电学特性(英文) 期刊论文
功能材料与器件学报, 2009, 卷号: 15, 期号: 1, 页码: 71-74
作者:  武德起;  姚金城;  赵红生;  张东炎;  常爱民
收藏  |  浏览/下载:33/0  |  提交时间:2012/11/29


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