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Island diodes triggering SCR in waffle layout with high failure current for HV ESD protection
期刊论文
SOLID-STATE ELECTRONICS, 2019, 卷号: 152, 页码: 17-23
作者:
Zheng, Yifei[1]
;
Jin, Xiangliang[2]
;
Wang, Yang[3]
;
Guan, Jian[4]
;
Hao, Sanwan[5]
收藏
  |  
浏览/下载:37/0
  |  
提交时间:2019/04/22
Electrostatic discharge
Waffle layout
Island diode triggering SCR
HV ESD protection
3-D device simulation
Failure current
High voltage InGaN/GaN/AlGaN RTD suitable for ESD protection applications of GaN/InGaN-based devices and ICs validated by simulation results
会议论文
2018 25TH IEEE INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS (IPFA), 2018-01-01
作者:
Zhang Haipeng
;
Geng Lu
;
Lin Mi
;
Zhang Zhonghai
;
Lu Weifeng
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2019/12/02
InGaN/GaN/AlGaN
High voltage RTD
ESD protection
GaN/InGaN-based devices and ICs
United quantum regulation
Improving ESD Protection Robustness Using SiGe Source/Drain Regions in Tunnel FET
期刊论文
2018, 卷号: 9
作者:
Yang, Zhaonian
;
Yang, Yuan
;
Yu, Ningmei
;
Liou, Juin J.
收藏
  |  
浏览/下载:7/0
  |  
提交时间:2019/12/20
band-to-band tunneling (BTBT)
electrostatic discharge (ESD)
tunnel field-effect transistor (TFET)
Silicon-Germanium source
drain (SiGe S
D)
technology computer aided design (TCAD)
Low-Leakage ESD Power Clamp Design With Adjustable Triggering Voltage for Nanoscale Applications
期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2017
Lu, Guangyi
;
Wang, Yuan
;
Wang, Yize
;
Zhang, Xing
收藏
  |  
浏览/下载:7/0
  |  
提交时间:2017/12/03
Electrostatic discharge (ESD)
ESD power clamp
false-triggering immunity
leakage current
triggering voltage
TECHNOLOGY
PROTECTION
CIRCUITS
Power-Rail ESD Clamp Circuit with Parasitic-BJT and Channel Parallel Shunt Paths to Achieve Enhanced Robustness
期刊论文
IEICE TRANSACTIONS ON ELECTRONICS, 2017
Wang, Yuan
;
Lu, Guangyi
;
Wang, Yize
;
Zhang, Xing
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2017/12/03
electrostatic discharge (ESD)
robustness
false-triggering immunity
transmission-line-pulsing (TLP) test
NANOSCALE CMOS TECHNOLOGY
PROTECTION
DESIGN
NMOS
Insight into multiple-triggering effect in DTSCRs for ESD protection
期刊论文
半导体学报(英文版), 2017
Lizhong Zhang
;
Yuan Wang
;
Yize Wang
;
Yandong He
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2017/12/03
electrostatic discharge (ESD) diode-triggered silicon-controlled rectifier (DTSCR) double snapback transmission line pulse (TLP) test
electrostatic discharge (ESD)
diode-triggered silicon-controlled rectifier (DTSCR)
double snapback
transmission line pulse (TLP) test
Electrostatic-spraying an ultrathin, multifunctional and compact coating onto a cathode for a long-life and high-rate lithium-sulfur battery
期刊论文
NANO ENERGY, 2016, 卷号: 30, 页码: 138-145
作者:
Niu, Shuzhang
;
Lv, Wei
;
Zhou, Guangmin
;
Shi, Huifa
;
Qin, Xianying
收藏
  |  
浏览/下载:9/0
  |  
提交时间:2021/02/02
Multifunctional polysulfide blocking layer
Electrostatic-spraying deposition
Lithium sulfur batteries
High-rate performance
Long cycle life
Electrostatic-spraying an ultrathin, multifunctional and compact coating onto a cathode for a long-life and high-rate lithium-sulfur battery
期刊论文
NANO ENERGY, 2016, 卷号: 30, 页码: 138-145
作者:
Niu, Shuzhang
;
Lv, Wei
;
Zhou, Guangmin
;
Shi, Huifa
;
Qin, Xianying
收藏
  |  
浏览/下载:15/0
  |  
提交时间:2021/02/02
Multifunctional polysulfide blocking layer
Electrostatic-spraying deposition
Lithium sulfur batteries
High-rate performance
Long cycle life
A wafer-level characterization method of ESD protection circuits for both component-level and system-level applications
其他
2016-01-01
Wang, Yuan
;
Lu, Guangyi
;
Zhang, Xing
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2017/12/03
Optimization on Layout Strategy of Gate-Grounded NMOS for On-Chip ESD Protection in a 65-nm CMOS Process
期刊论文
IEICE TRANSACTIONS ON ELECTRONICS, 2016
Lu, Guangyi
;
Wang, Yuan
;
Zhang, Xing
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2017/12/03
electrostatic discharge (ESD)
gate-grounded NMOS (ggNMOS)
substrate-pickup stripes
transmission-line-pulsing (TLP) test
DEVICES
PICKUP
TRANSISTORS
TECHNOLOGY
ROBUSTNESS
IMPACT
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