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浏览/检索结果: 共5条，第1-5条 帮助 限定条件 专题：华南理工大学    第一署名单位    第一作者单位    通讯作者单位     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Reliability estimation model of IC's interconnect based on uniform distribution of defects on a chip (CPCI-S收录) 会议论文 18TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS 作者:  Zhao, TX;  Duan, XC 收藏  |  浏览/下载：0/0  |  提交时间：2019/04/19 interconnection lifetime  electromigration effect  defect   Reliability estimation model of IC's interconnect based on uniform distribution of defects on a chip (EI收录) 会议论文 Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, Boston, MA, United states, November 3, 2003 - November 5, 2003 作者:  Zhao, Tianxu[1,2];  Hao, Yue[1,2];  Ma, Peijun[2] 收藏  |  浏览/下载：2/0  |  提交时间：2019/04/19 Defects  Electromigration  Fault tolerance  Integrated circuits   Thermal-Mechanical Reliability Assessment of TSV Structure for 3D IC Integration (CPCI-S收录) 会议 作者:  Liu, Huan[1];  Zeng, Qinghua[1];  Guan, Yong[1];  Fang, Runiu[1];  Sun, Xin[1] 收藏  |  浏览/下载：2/0  |  提交时间：2019/04/11 Characteristic recognition of IC chip's micro-topography defects based on image projection transformation and energy optimization modeling (EI收录) 会议论文 Advanced Materials Research, Guangzhou, China, December 7, 2010 - December 9, 2010 作者:  Liang, Zhongwei[1];  Zhang, Chunliang[1];  Wang, Yijun[1];  Xiao, Zhongmin[1] 收藏  |  浏览/下载：0/0  |  提交时间：2019/04/16 Cameras  CCD cameras  Curve fitting  Defects  Industrial engineering  Manufacture  Optical projectors  Optimization  Reliability analysis  Topography   Design for improved NBTI reliability of CMOS digital IC (EI收录) 会议论文 2010 IEEE International Conference of Electron Devices and Solid-State Circuits, EDSSC 2010, Hong Kong, China, December 15, 2010 - December 17, 2010 作者:  Liu, Lining[1];  Li, Bin[1];  Zhao, Mingjian[1];  Xie, Jiang[2] 收藏  |  浏览/下载：0/0  |  提交时间：2019/04/16 Design  Digital integrated circuits  Electric network analysis  Electric network topology  Integrated circuits  Reliability