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	Characteristic recognition of IC chip's micro-topography defects based on image projection transformation and energy optimization modeling (EI收录)
	Liang, Zhongwei[1]; Zhang, Chunliang[1]; Wang, Yijun[1]; Xiao, Zhongmin[1]
会议名称	Advanced Materials Research
会议日期	December 7, 2010 - December 9, 2010
会议地点	Guangzhou, China
关键词	Cameras CCD cameras Curve fitting Defects Industrial engineering Manufacture Optical projectors Optimization Reliability analysis Topography
URL标识	查看原文
内容类型	会议论文
URI标识	http://www.corc.org.cn/handle/1471x/2063774
专题	华南理工大学
作者单位	[1] School of Mechanical and Electrical Engineering, Guangzhou University, Guangzhou, China
推荐引用方式 GB/T 7714	Liang, Zhongwei[1],Zhang, Chunliang[1],Wang, Yijun[1],等. Characteristic recognition of IC chip's micro-topography defects based on image projection transformation and energy optimization modeling (EI收录)[C]. 见:Advanced Materials Research. Guangzhou, China. December 7, 2010 - December 9, 2010.

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