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Si3N4/Al2O3 Stack Layer Passivation for InAlAs/InGaAs InP-based HEMTs with Good DC and RF Performances 期刊论文
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, 2017
作者:  Chen C(陈晨);  Ding P(丁芃);  Niu JB(牛洁斌);  Yang F(杨枫);  Ding WC(丁武昌)
收藏  |  浏览/下载:13/0  |  提交时间:2018/05/15
Interfacial modulation and electrical properties improvement of solution-processed ZrO2 gate dielectrics upon Gd incorporation 期刊论文
JOURNAL OF ALLOYS AND COMPOUNDS, 2017, 卷号: 699, 期号: 无, 页码: 415-420
作者:  Xiao, D. Q.;  He, G.;  Lv, J. G.;  Wang, P. H.;  Liu, M.
收藏  |  浏览/下载:14/0  |  提交时间:2018/07/04
Influence of using amorphous silicon stack as front heterojunction structure on performance of interdigitated back contact-heterojunction solar cell (IBC-HJ) 期刊论文
Frontiers in Energy, 2017
作者:  Tao K(陶科);  Jia R(贾锐);  Li Q(李强);  Dai XW(戴小宛);  Sun HC(孙恒超)
收藏  |  浏览/下载:15/0  |  提交时间:2018/05/15
Modulation of interfacial and electrical properties of ALD-derived HfAlO/Al2O3/Si gate stack by annealing temperature 期刊论文
JOURNAL OF ALLOYS AND COMPOUNDS, 2017, 卷号: 691, 期号: 无, 页码: 504-513
作者:  Gao, J.;  He, G.;  Liu, M.;  Lv, J. G.;  Sun, Z. Q.
收藏  |  浏览/下载:18/0  |  提交时间:2017/11/21
Interfacial modulation and electrical properties improvement of solution-processed ZrO2 gate dielectrics upon Gd incorporation 期刊论文
Journal of Alloys and Compounds, 2017, 卷号: Vol.699, 页码: 415-420
作者:  Li,W. D.;  Lv,J. G.;  Jin,P.;  Xiao,D. Q.;  Wang,P. H.
收藏  |  浏览/下载:4/0  |  提交时间:2019/04/22
Modulation of interfacial and electrical properties of ALD-derived HfAlO/Al2O3/Si gate stack by annealing temperature 期刊论文
Journal of Alloys and Compounds, 2017, 卷号: Vol.691, 页码: 504-513
作者:  Lv,J. G.;  Jin,P.;  Xiao,D. Q.;  Zheng,C. Y.;  Chen,X. S.
收藏  |  浏览/下载:4/0  |  提交时间:2019/04/22
Nitrogen-concentration modulated interface quality, band alignment and electrical properties of HfTiON/Ge gate stack pretreated by trimethylaluminum precursor 期刊论文
Materials Research Bulletin, 2017, 卷号: Vol.91, 页码: 166-172
作者:  Lv,J. G.;  Xiao,D. Q.;  Cheng,C.;  Sun,Z. Q.;  Gao,J.
收藏  |  浏览/下载:3/0  |  提交时间:2019/04/22
Characterization of the electronic structure and thermal stability of HfO2/SiO2/Si gate dielectric stack 期刊论文
SURFACE AND INTERFACE ANALYSIS, 2017, 卷号: 49, 期号: 8
作者:  Duan, T. L.;  Pan, L.;  Zhang, Z.;  Tok, E. S.;  Pan, J. S.
收藏  |  浏览/下载:3/0  |  提交时间:2019/12/05
多机器人系统编队的通信及控制 学位论文
2017
作者:  侯静茹
收藏  |  浏览/下载:8/0  |  提交时间:2020/11/05


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