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Particle-based chemical oscillation as a function of depth in latex films using gas cluster ion beam secondary ion mass spectrometry profiling 期刊论文
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2018, 卷号: 36, 期号: 3
作者:  Pacholski, Michaeleen L.;  Qu, Zhaohui;  Ouyang, Wuye;  Zheng, Zhibo;  Wang, Rong
收藏  |  浏览/下载:11/0  |  提交时间:2019/04/09


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