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浏览/检索结果: 共3条，第1-3条 帮助 限定条件 发表日期：2024     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择发表日期升序发表日期降序提交时间升序提交时间降序题名升序题名降序作者升序作者降序 TA-denseNet: Efficient hardware trust and assurance model based on feature extraction and comparison of SEM images and GDSII images 期刊论文 INTEGRATION-THE VLSI JOURNAL, 2024, 卷号: 95, 页码: 9 作者:  Xiao, Wei;  Zhao, Fazhan;  Zhao, Kun;  Ma, Hongtu;  Li, Qing 收藏  |  浏览/下载：1/0  |  提交时间：2024/02/20 Scanning electron microscopy  Deep learning  Hardware trust and assurance  Integrated circuit   Powerful-IoU: More straightforward and faster bounding box regression loss with a nonmonotonic focusing mechanism 期刊论文 NEURAL NETWORKS, 2024, 卷号: 170, 页码: 276-284 作者:  Liu, Can;  Wang, Kaige;  Li, Qing;  Zhao, Fazhan;  Zhao, Kun 收藏  |  浏览/下载：2/0  |  提交时间：2024/02/22 Object detection  Bounding box regression  Loss function design  Focusing mechanism   Novel methods for locating and matching IC cells based on standard cell libraries 期刊论文 MICROELECTRONIC ENGINEERING, 2024, 卷号: 283, 页码: 12 作者:  Liu, Can;  Wang, Kaige;  Li, Qing;  Zhao, Fazhan;  Zhao, Kun 收藏  |  浏览/下载：2/0  |  提交时间：2024/02/22 Reverse engineering  Integrated circuits  Scanning electron microscopy  Image processing  Hardware security