Novel methods for locating and matching IC cells based on standard cell libraries

doi:10.1016/j.mee.2023.112107

CORC > 自动化研究所 > 中国科学院自动化研究所 > 脑图谱与类脑智能实验室

	Novel methods for locating and matching IC cells based on standard cell libraries
	Liu, Can 1,2; Wang, Kaige 3; Li, Qing 1; Zhao, Fazhan 1; Zhao, Kun 4; Ma, Hongtu 4
刊名	MICROELECTRONIC ENGINEERING
	2024
卷号	283 页码:12
关键词	Reverse engineering Integrated circuits Scanning electron microscopy Image processing Hardware security
ISSN号	0167-9317
DOI	10.1016/j.mee.2023.112107
通讯作者	Liu, Can(canliu@whu.edu.cn) ; Li, Qing(liqing@ime.ac.cn)
英文摘要	In the domain of hardware assurance, reverse engineering (RE) is essential for ensuring the security and reliability of integrated circuits (ICs). A potential approach in the crucial step of netlist extraction involves matching patterns in IC images to standard cell libraries. However, the morphological variations in images of cells and intra-cell similarities present significant challenges to effective matching. This paper introduces a new matching dataset of cells in Scanning Electron Microscopy (SEM) images and standard cells, including 579 SEM cells, two standard cell libraries, and 508 types of standard cells. Furthermore, we propose a novel matching method reliant on standard cell libraries. This method generates templates using the feature information of standard cells and conducts matching by comparing the similarity between the feature vector sets of an SEM cell and the templates, achieving a 100% accuracy rate on the matching dataset. Given that the matching method relies on accurate cell localization, we propose two methods of merging bounding boxes. These methods can convert the object detector's detection results on patches into localization results on the entire image, achieving 99.48% accuracy and 99.31% recall on the image of the matching dataset. Finally, We consolidate these methods into a comprehensive workflow for automating the extraction of cell information in large-scale IC images.
资助项目	National Key Research and Development Program of China[2021YFB3100904]
WOS关键词	HARDWARE ; ALGORITHM ; NOISE
WOS研究方向	Engineering ; Science & Technology - Other Topics ; Optics ; Physics
语种	英语
出版者	ELSEVIER
WOS记录号	WOS:001104106700001
资助机构	National Key Research and Development Program of China
内容类型	期刊论文
源URL	[http://ir.ia.ac.cn/handle/173211/55207]
专题	脑图谱与类脑智能实验室
通讯作者	Liu, Can; Li, Qing
作者单位	1.Chinese Acad Sci IMECAS, Inst Microelect, Beijing, Peoples R China 2.Univ Chinese Acad Sci, Sch Integrated Circuits, Beijing 100020, Peoples R China 3.China Acad Aerosp Sci & Innovat, Beijing 100048, Peoples R China 4.Chinese Acad Sci, Inst Automat, Beijing 100190, Peoples R China
推荐引用方式 GB/T 7714	Liu, Can,Wang, Kaige,Li, Qing,et al. Novel methods for locating and matching IC cells based on standard cell libraries[J]. MICROELECTRONIC ENGINEERING,2024,283:12.
APA	Liu, Can,Wang, Kaige,Li, Qing,Zhao, Fazhan,Zhao, Kun,&Ma, Hongtu.(2024).Novel methods for locating and matching IC cells based on standard cell libraries.MICROELECTRONIC ENGINEERING,283,12.
MLA	Liu, Can,et al."Novel methods for locating and matching IC cells based on standard cell libraries".MICROELECTRONIC ENGINEERING 283(2024):12.