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浏览/检索结果: 共5条，第1-5条 帮助 限定条件 专题：北京大学    第一署名单位    第一作者单位    通讯作者单位     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Improvement mechanism of resistance random access memory with supercritical CO2 fluid treatment 期刊论文 journal of supercritical fluids, 2014 Chang, Kuan-Chang; Chen, Jung-Hui; Tsai, Tsung-Ming; Chang, Ting-Chang; Huang, Syuan-Yong; Zhang, Rui; Chen, Kai-Huang; Syu, Yong-En; Chang, Geng-Wei; Chu, Tian-Jian; Liu, Guan-Ru; Su, Yu-Ting; Chen, Min-Chen; Pan, Jhih-Hong; Liao, Kuo-Hsiao; Tai, Ya-Hsiang; Young, Tai-Fa; Sze, Simon M.; Ai, Chi-Fong; Wang, Min-Chuan; Huang, Jen-Wei 收藏  |  浏览/下载：3/0  |  提交时间：2015/11/11 Supercritical fluid  RRAM  Hydration-dehydration reaction  Tin doping  ELECTROLYTE-BASED RERAM  CONDUCTIVE FILAMENTS  FILM   Synthesis and electroactive properties of poly(amidoamine) dendrimers with an aniline pentamer shell 期刊论文 材料化学杂志, 2011 Hung, Wei-I; Hung, Chih-Bing; Chang, Ya-Han; Dai, Jiun-Kuang; Li, Yan; He, Hai; Chen, Shao-Wen; Huang, Tsao-Cheng; Wei, Yen; Jia, Xin-Ru; Yeh, Jui-Ming 收藏  |  浏览/下载：2/0  |  提交时间：2015/11/12 TRANSPORT-PROPERTIES  POLYANILINE  POLYMERIZATION  POLYMERS  ELECTRORHEOLOGY  POLYAMIDOAMINE  COMPLEXES  COPOLYMER  OXIDATION  SALT   Experimental investigation of the reliability issue of RRAM based on high resistance state conduction 期刊论文 nanotechnology, 2011 Zhang, Lijie; Hsu, Yen-Ya; Chen, Frederick T.; Lee, Heng-Yuan; Chen, Yu-Sheng; Chen, Wei-Su; Gu, Pei-Yi; Liu, Wen-Hsing; Wang, Shun-Min; Tsai, Chen-Han; Huang, Ru; Tsai, Ming-Jinn 收藏  |  浏览/下载：1/0  |  提交时间：2015/11/10 HFO2 THIN-FILMS  POOLE-FRENKEL  GATE STACKS  MECHANISM  OXIDE   Statistical Analysis of Retention Behavior and Lifetime Prediction of HfO(x)-based RRAM 其他 2011-01-01 Zhang, Lijie; Huang, Ru; Hsu, Yen-Ya; Chen, Frederick T.; Lee, Heng-Yuan; Chen, Yu-Sheng; Chen, Wei-Su; Gu, Pei-Yi; Liu, Wen-Hsing; Wang, Shun-Min; Tsai, Chen-Han; Tsai, Ming-Jinn; Chen, Pang-Shiu 收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13 lifetime  data retention  breakdown  RRAM  MECHANISM  POWER   Statistical analysis of retention behavior and lifetime prediction of HfOBxB-based RRAM 其他 2011-01-01 Zhang, Lijie; Huang, Ru; Hsu, Yen-Ya; Chen, Frederick T.; Lee, Heng-Yuan; Chen, Yu-Sheng; Chen, Wei-Su; Gu, Pei-Yi; Liu, Wen-Hsing; Wang, Shun-Min; Tsai, Chen-Han; Tsai, Ming-Jinn; Chen, Pang-Shiu 收藏  |  浏览/下载：5/0  |  提交时间：2015/11/13