CORC

浏览/检索结果: 共17条,第1-10条 帮助

限定条件    
已选(0)清除 条数/页:   排序方式:
Extended Hydrodynamic Models and Multigrid Solver of a Silicon Diode Simulation 其他
2016-01-01
Hu, Zhicheng; Li, Ruo; Qiao, Zhonghua
收藏  |  浏览/下载:2/0  |  提交时间:2017/12/03
Bias-dependent High Frequency Characterization of Through-Silicon Via (TSV) for 3D Integration 其他
2016-01-01
Sun, Xin; Fang, Runiu; Liu, Huan; Miao, Min; Jin, Yufeng
收藏  |  浏览/下载:5/0  |  提交时间:2017/12/03
Logistic regression bias correction for large scale data with rare events 其他
2013-01-01
Qiu, Zhen; Li, Hongyan; Su, Hanchen; Ou, Gaoyan; Wang, Tengjiao
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/17
Optically powered ZnO nanowires with symmetric and asymmetric contacts 其他
2013-01-01
Zhang, Lihuan; Zhang, Xiaoxian; Lai, Jialin; Liu, Zhao; Hou, Shimin; Xie, Sishen; Gao, Min
收藏  |  浏览/下载:7/0  |  提交时间:2017/12/03
Analysis and modeling of geometry dependent thermal resistance in silicon-on-insulator metal-oxide-semiconductor field-effect transistors 其他
2013-01-01
Zhou, Xingye; Inoue, Takuya; Kitamura, Masashi; Matsuura, Kai; Miyake, Masataka; Iizuka, Takahiro; Umeda, Takuya; Kikuchihara, Hideyuki; Mattausch, Hans Juergen; He, Jin; Miura-Mattausch, Mitiko
收藏  |  浏览/下载:3/0  |  提交时间:2017/12/03
Stability of Zinc Oxide Thin-Film Transistors 其他
2012-01-01
Li, Shao-juan; Sun, Lei; Han, De-dong; Wang, Yi; Han, Ru-qi; Zhang, Sheng-dong
收藏  |  浏览/下载:5/0  |  提交时间:2015/11/13
Characterization and analysis of pattern dependent variation-aware interconnects for a 65nm technology 其他
2011-01-01
Jiang, Lele; Qin, Xiaojing; Chang, Lifu; Cheng, Yuhua
收藏  |  浏览/下载:3/0  |  提交时间:2015/11/10
Investigation on the reliability corner of pMOSFETs with drain-bias-dependent NBTI degradation 其他
2010-01-01
He, Yandong; Zhang, Ganggang; Duan, Xiaorong
收藏  |  浏览/下载:3/0  |  提交时间:2015/11/13
Drain bias effect on the interface traps of pMOSFETs under negative bias temperature stress 其他
2009-01-01
Pan, J.Y.; Yang, J.Q.; Qiao, Y.; Liu, X.Y.; Han, R.Q.; Kang, J.F.; Liao, C.C.; Wu, H.M.; Wu, Y.J.
收藏  |  浏览/下载:4/0  |  提交时间:2015/11/13
Recovery Characteristics of NBTI of pMOSFETs with Oxynitride Dielectrics Under Drain Bias 其他
2008-01-01
Yang, Jiaqi; Pan, Junyan; Huang, Lihua; Liu, Xiaoyan; Han, Ruqi; Kang, Jinfeng; Zhang, L. F.; Zhu, Z. W.; Liao, C. C.; Wu, H. M.
收藏  |  浏览/下载:1/0  |  提交时间:2015/11/10


©版权所有 ©2017 CSpace - Powered by CSpace