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CORC

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Verification of SEU resistance in 65 nm high-performance SRAM with dual DICE interleaving and EDAC mitigation strategies 期刊论文
NUCLEAR SCIENCE AND TECHNIQUES, 2021, 卷号: 32, 期号: 12, 页码: 13
作者:  He, Ze;  Zhao, Shi-Wei;  Liu, Tian-Qi;  Cai, Chang;  Yan, Xiao-Yu
收藏  |  浏览/下载：68/0  |  提交时间：2022/01/12
Design, Application, and Verification of the Novel SEU Tolerant Abacus-Type Layouts 期刊论文
ELECTRONICS, 2021, 卷号: 10, 期号: 23, 页码: 11
作者:  Sun, Yi;  Li, Zhi;  He, Ze;  Chi, Yaqing
收藏  |  浏览/下载：11/0  |  提交时间：2022/04/11
Evaluation of helium effect on irradiation hardening in F82H, ODS, SIMP and T91 steels by nano-indentation method 期刊论文
FUSION ENGINEERING AND DESIGN, 2019, 卷号: 142, 页码: 6-12
作者:  Li, Bingsheng;  Wang, Zhiguang;  Wei, Kongfang;  Shen, Tielong;  Yao, Cunfeng
收藏  |  浏览/下载：65/0  |  提交时间：2019/11/10
Radiation hardening design for spin-orbit torque magnetic random access memory 会议论文
2018 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS), 2018-01-01
作者:  Wang, Bi;  Wang, Zhaohao;  Cao, Kaihua;  Zhang, Youguang;  Zhao, Yuanfu
收藏  |  浏览/下载：3/0  |  提交时间：2019/12/30
Radiation-Hardening Techniques for Spin Orbit Torque-MRAM Peripheral Circuitry 期刊论文
IEEE TRANSACTIONS ON MAGNETICS, 2018, 卷号: 54
作者:  Wang, Bi;  Wang, Zhaohao;  Hu, Chunyan;  Zhao, Yuanfu;  Zhang, Youguang
收藏  |  浏览/下载：11/0  |  提交时间：2019/12/30
Development of single-event-effects analysis system at the IMP microbeam facility 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2017, 卷号: 404, 页码: 250-253
作者:  Du, Guanghua;  Bi, Jinshun;  Ma, Shuyi;  Liu, Xiaojun;  Sheng, Lina
收藏  |  浏览/下载：26/0  |  提交时间：2018/05/31
Development of single-event-effects analysis system at the IMP microbeam facility 会议论文
作者:  Guo, Jinlong;  Ma, Shuyi;  Liu, Xiaojun;  Sheng, Lina;  Li, Yaning
收藏  |  浏览/下载：20/0  |  提交时间：2018/08/20
Development of single-event-effects analysis system at the IMP microbeam facility 会议论文
作者:  Sheng, Lina;  Guo, Jinlong;  Du, Guanghua;  Bi, Jinshun;  Liu, Wenjing
收藏  |  浏览/下载：26/0  |  提交时间：2018/08/20
Single-event transient characterization of a radiation-tolerant charge-pump phase-locked loop fabricated in 130 nm pd-soi technology 期刊论文
Ieee transactions on nuclear science, 2016, 卷号: 63, 期号: 4, 页码: 2402-2408
作者:  Chen, Zhuojun;  Lin, Min;  Zheng, Yunlong;  Wei, Zuodong;  Huang, Shuigen
收藏  |  浏览/下载：42/0  |  提交时间：2019/05/09

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