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CORC

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Microstructure and electrical properties of y(no3)(3)center dot 6h(2)o-doped zno-bi2o3-based varistor ceramics 期刊论文
Journal of alloys and compounds, 2011, 卷号: 509, 期号: 38, 页码: 9312-9317
作者:  
收藏  |  浏览/下载：206/0  |  提交时间：2019/05/12
Metamorphic ingaas p-i-n photodetectors with 1.75 mu m cut-off wavelength grown on gaas 期刊论文
Chinese physics letters, 2010, 卷号: 27, 期号: 3, 页码: 4
作者:  Zhu Bin;  Han Qin;  Yang Xiao-Hong;  Ni Hai-Qiao;  He Ji-Fang
收藏  |  浏览/下载：21/0  |  提交时间：2019/05/12
Metamorphic InGaAs p-i-n Photodetectors with 1.75 mu m Cut-Off Wavelength Grown on GaAs 期刊论文
chinese physics letters, 2010, 卷号: 27, 期号: 3, 页码: art. no. 038504
Zhu B (Zhu Bin); Han Q (Han Qin); Yang XH (Yang Xiao-Hong); Ni HQ (Ni Hai-Qiao); He JF (He Ji-Fang); Niu ZC (Niu Zhi-Chuan); Wang X (Wang Xin); Wang XP (Wang Xiu-Ping); Wang J (Wang Jie)
收藏  |  浏览/下载：124/5  |  提交时间：2010/04/22
Using different carrier gases to control AlN film stress and the effect on morphology, structural properties and optical properties 期刊论文
journal of physics d-applied physics, 2007, 卷号: 40, 期号: 23, 页码: 7462-7466
Hu, WG; Liu, XL; Jiao, CM; Wei, HY; Kang, TT; Zhang, PF; Zhang, RQ; Fan, HB; Zhu, QS
收藏  |  浏览/下载：55/4  |  提交时间：2010/03/08
High quality microcrystalline si films by hydrogen dilution profile 期刊论文
Thin solid films, 2006, 卷号: 515, 期号: 2, 页码: 452-455
作者:  Gu, Jinhua;  Zhu, Meifang;  Wang, Liujiu;  Liu, Fengzhen;  Zhou, Bingqing
收藏  |  浏览/下载：11/0  |  提交时间：2019/05/12
Influence of Al content on electrical and structural properties of Si-doped AlxGa1-xN/GaN HEMT structures 会议论文
32nd international symposium on compound semiconductors, rust, germany, sep 18-22, 2005
Wang, CM; Wang, XL; Hu, GX; Wang, JX; Li, JP
收藏  |  浏览/下载：119/30  |  提交时间：2010/03/29
1.3 mu m high indium content (42.5%) GaInNAs/GaAs quantum wells grown by molecular beam epitaxy 会议论文
32nd international symposium on compound semiconductors, rust, germany, sep 18-22, 2005
Niu, ZC; Zhang, SY; Ni, HQ; Wu, DH; He, ZH; Sun, Z; Han, Q; Wu, RG
收藏  |  浏览/下载：223/60  |  提交时间：2010/03/29
Comparison between double crystals X-ray diffraction micro-Raman measurement on composition determination of high Ge content Si1_xGex layer epitaxied on Si substrate 期刊论文
journal of materials science & technology, 2006, 卷号: 22, 期号: 5, 页码: 651-654
Zhao L (Zhao Lei); Zuo YH (Zuo Yuhua); Cheng BW (Cheng Buwen); Yu JZ (Yu Jinzhong); Wang QM (Wang Qiming)
收藏  |  浏览/下载：37/0  |  提交时间：2010/04/11
High quality microcrystalline Si films by hydrogen dilution profile 期刊论文
thin solid films, 2006, 卷号: 515, 期号: 2, 页码: 452-455
Gu JH (Gu Jinhua); Zhu MF (Zhu Meifang); Wang LJ (Wang Liujiu); Liu FZ (Liu Fengzhen); Zhou BQ (Zhou Bingqing); Ding K (Ding Kun); Li GH (Li Guohua)
收藏  |  浏览/下载：38/0  |  提交时间：2010/04/11
High quality microcrystalline Si films by hydrogen dilution profile 会议论文
12th international conference on thin films, bratislava, slovakia, sep 15-20, 2002
Gu, JH (Gu, Jinhua); Zhu, MF (Zhu, Meifang); Wang, LJ (Wang, Liujiu); Liu, FZ (Liu, Fengzhen); Zhou, BQ (Zhou, Bingqing); Ding, K (Ding, Kun); Li, GH (Li, Guohua)
收藏  |  浏览/下载：189/19  |  提交时间：2010/03/29

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