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科研机构
半导体研究所 [7]
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期刊论文 [7]
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2011 [1]
2009 [1]
2006 [2]
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半导体材料 [7]
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The transition from two-stage to three-stage evolution of wetting layer of InAs/GaAs quantum dots caused by postgrowth annealing
期刊论文
applied physics letters, 2011, 卷号: 98, 期号: 7, 页码: article no.71914
作者:
Jin P
;
Ye XL
;
Zhou XL
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浏览/下载:52/4
  |  
提交时间:2011/07/05
SPECTROSCOPY
Well-width dependence of in-plane optical anisotropy in (001) GaAs/AlGaAs quantum wells induced by in-plane uniaxial strain and interface asymmetry
期刊论文
journal of applied physics, 2009, 卷号: 105, 期号: 10, 页码: art. no. 103108
作者:
Xu B
;
Ye XL
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  |  
浏览/下载:69/0
  |  
提交时间:2010/03/08
aluminium compounds
gallium arsenide
III-V semiconductors
internal stresses
reflectivity
semiconductor heterojunctions
semiconductor quantum wells
Raman scattering detection of stacking faults in free-standing cubic-SiC epilayer
期刊论文
chinese physics letters, 2006, 卷号: 23, 期号: 10, 页码: 2834-2837
Liu XF (Liu Xing-Fang)
;
Sun GS (Sun Guo-Sheng)
;
Li JM (Li Jin-Min)
;
Zhao YM (Zhao Yong-Mei)
;
Li JY (Li Jia-Ye)
;
Wang L (Wang Lei)
;
Zhao WS (Zhao Wan-Shun)
;
Zeng YP (Zeng Yi-Ping)
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  |  
浏览/下载:75/0
  |  
提交时间:2010/04/11
SPECTROSCOPY
GROWTH
POLYTYPES
SILICON
Nanoinstabilities as revealed by shrinkage of nanocavities in silicon during irradiation
期刊论文
international journal of nanotechnology, 2006, 卷号: 3, 期号: 4 sp.iss.si, 页码: 492-516
Zhu, XF (Zhu, Xianfang)
;
Wang, ZG (Wang, Zhanguo)
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  |  
浏览/下载:60/0
  |  
提交时间:2010/03/29
nanocavity
nanoparticle
nanoinstabilities
open volume defect
thermodynamic nonequilibrium
nanosize
nanotime
energetic beam irradiation
amorphous structure
nanocurvature
surface energy
WALLED CARBON NANOTUBES
AMORPHOUS-SILICON
ION IRRADIATION
PREFERENTIAL AMORPHIZATION
IN-SITU
INSTABILITY
BEAM
IMPLANTATION
CAVITIES
POINT
A geometrical model of GaN morphology in initial growth stage
期刊论文
journal of crystal growth, 2002, 卷号: 234, 期号: 1, 页码: 115-120
作者:
Han PD
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浏览/下载:79/8
  |  
提交时间:2010/08/12
computer simulation
crystal morphology
atomic force microscopy
nitrides
AIN BUFFER LAYER
SAPPHIRE
Resonant Raman scattering of a-SiNx : H
期刊论文
materials letters, 2001, 卷号: 47, 期号: 1-2, 页码: 50-54
Wang Y
;
Yue RF
;
Han HX
;
Liao XB
;
Wang YQ
;
Diao HW
;
Kong GL
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  |  
浏览/下载:65/0
  |  
提交时间:2010/08/12
a-Sin(x): H films
resonant Raman scattering
quantum confinement model
POLYCRYSTALLINE DIAMOND FILMS
AMORPHOUS-SILICON
HYDROGENATED MICROCRYSTALLINE
SPECTROSCOPY
ALLOYS
Point defects in III-V compound semiconductors
期刊论文
defects and diffusion in semiconductors, 2000, 卷号: 183-1, 期号: 0, 页码: 85-93
Chen N
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浏览/下载:44/0
  |  
提交时间:2010/08/12
compound semiconductors
point defects
deep level centres
stoichiometry
MOLECULAR-BEAM EPITAXY
GAAS SINGLE-CRYSTALS
SEMIINSULATING GALLIUM-ARSENIDE
SEMI-INSULATING GAAS
ELECTRICAL-PROPERTIES
LATTICE-PARAMETER
NATIVE DEFECTS
CARBON
DIFFRACTOMETER
STOICHIOMETRY
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