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北京大学 [3]
物理研究所 [2]
厦门大学 [1]
兰州大学 [1]
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期刊论文 [8]
会议论文 [1]
其他 [1]
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2003 [10]
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Physics, M... [1]
metal plat... [1]
半导体材料 [1]
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Highly dispersed metal nanoparticles in porous anodic alumina films prepared by a breathing process of polyacrylamide hydrogel
期刊论文
CHEMISTRY OF MATERIALS, 2003, 卷号: 15, 期号: 22, 页码: 4332-4336
作者:
Guo, YG
;
Hu, JS
;
Liang, HP
;
Wan, LJ
;
Bai, CL
收藏
  |  
浏览/下载:15/0
  |  
提交时间:2019/04/09
Third-order optical nonlinearity and negative photoconductivity of Ge nanocrystals in Al2O3 dielectric
期刊论文
NANOTECHNOLOGY, 2003, 卷号: 14, 期号: 11, 页码: L15
Wan, Q
;
Wang, TH
;
Lin, CL
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  |  
浏览/下载:12/0
  |  
提交时间:2013/09/23
CHEMICAL-VAPOR-DEPOSITION
SI NANOCRYSTALS
SILICON NANOCRYSTALS
PHOTOLUMINESCENCE
OXIDE
SIO2-FILMS
MATRIX
BEAM
Characteristics of LaAlO3/Si(100) deposited under various oxygen pressures
期刊论文
JOURNAL OF APPLIED PHYSICS, 2003, 卷号: 93, 期号: 1, 页码: 533
Xiang, WF
;
Lu, HB
;
Yan, L
;
Guo, HZ
;
Liu, LF
;
Zhou, YL
;
Yang, GZ
;
Jiang, JC
;
Cheng, HS
;
Chen, ZH
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  |  
浏览/下载:8/0
  |  
提交时间:2013/09/17
SRTIO3 THIN-FILMS
MOLECULAR-BEAM EPITAXY
ELECTRICAL-PROPERTIES
GATE DIELECTRICS
CEO2 LAYERS
SI
GROWTH
TEMPERATURE
SILICON
LAALO3
Reliability characteristics of high-K gate dielectrics HfO2 in metal-oxide semiconductor capacitors
其他
2003-01-01
Han, DD
;
Kang, JF
;
Lin, CH
;
Han, RQ
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  |  
浏览/下载:3/0
  |  
提交时间:2015/11/10
reliability
high-K
HfO2
gate dielectrics
INDUCED LEAKAGE CURRENT
HARD BREAKDOWN
SILICON
SIMULATION
MOSFETS
SOFT
The compatibility of ZnO piezoelectric film with micromachining process
期刊论文
sensors and actuators a physical, 2003
Xu, T
;
Wu, GY
;
ZHang, GB
;
Hao, YL
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  |  
浏览/下载:2/0
  |  
提交时间:2015/11/12
ZnO piezoelectric films
micromachining process
process compatibility
MEMS
microsensor fabrication
THIN-FILM
ZINC-OXIDE
DEPOSITION
FILTERS
Investigation of high-quality ultra-thin LaAlO3, films as high-k gate dielectrics
期刊论文
journal of physics d applied physics, 2003
Lu, XB
;
Liu, ZG
;
Zhang, X
;
Huang, R
;
Zhou, HW
;
Wang, XP
;
Nguyen, BY
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  |  
浏览/下载:3/0
  |  
提交时间:2015/11/16
STABILITY
Electrical properties of oxide-coated metal (Co, Cr, Ti) cluster assemblies
期刊论文
2003
Peng, D. L.
;
Hihara, T.
;
Sumiyama, K.
;
彭栋梁
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  |  
浏览/下载:2/0
  |  
提交时间:2013/12/12
PLASMA-GAS-CONDENSATION
SCALING THEORY
2 DIMENSIONS
FILMS
MAGNETORESISTANCE
LOCALIZATION
CONDUCTIVITY
PERCOLATION
TRANSPORT
SYSTEMS
Microstructural and electrical properties of ZrO2 thin films prepared on silicon on insulator with thin top silicon
期刊论文
CHINESE PHYSICS LETTERS, 2003, 卷号: 20, 期号: 2, 页码: 273-276
Zhang, NL
;
Song, ZT
;
Shen, QW
;
Lin, CL
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  |  
浏览/下载:7/0
  |  
提交时间:2012/03/24
FIELD-EFFECT-TRANSISTORS
K GATE DIELECTRICS
THERMAL-STABILITY
RELIABILITY
SI
Structural and optical properties of InAlGaN films grown directly on low-temperature buffer layer with (0001)sapphire substrate
期刊论文
journal of crystal growth, 2003, 卷号: 249, 期号: 1-2, 页码: 72-77
作者:
Li DB
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  |  
浏览/下载:57/0
  |  
提交时间:2010/08/12
nanostructures
stretched exponential
time-resolved photolummescence
metalorganic vapor phase epitaxy
nitrides
InAlGaN
INXALYGA1-X-YN QUATERNARY ALLOYS
TIME-RESOLVED PHOTOLUMINESCENCE
MULTIPLE-QUANTUM WELLS
ALINGAN/GAN HETEROSTRUCTURES
GAN
DECAY
LUMINESCENCE
SAPPHIRE
DEVICES
SILICON
A comparative study on electroluminescence from C-containing silicon oxide and Si-containing silicon oxide films
会议论文
Proceedings of the International Symposium of Young Scholars on Mechanics and Material Engineering for Science and Experiments, Changsha/Zhangjiajie, China, August 11, 2001 - August 16, 2001
作者:
Ma, S.Y.
;
Wu, X.C.
;
Wang, Q.Z.
;
Wang, Y.Y.
;
Wang, C.W.
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  |  
浏览/下载:1/0
  |  
提交时间:2017/01/20
Silicon compounds
Electroluminescence
Magnetron sputtering
Spectrum analysis
Forward bias
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