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Threshold Voltage Characteristics for Silicon Nanowire Field-Effect Transistor With a Double-Layer Gate Structure 期刊论文
IEEE Transactions on Electron Devices, 2019, 卷号: Vol.66 No.1, 页码: 771-776
作者:  Hongguan Yang
收藏  |  浏览/下载:11/0  |  提交时间:2019/12/13
Threshold Voltage Characteristics for Silicon Nanowire Field-Effect Transistor With a Double-Layer Gate Structure 期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2019, 卷号: Vol.66 No.1, 页码: 771-776
作者:  Yang, HG
收藏  |  浏览/下载:11/0  |  提交时间:2019/12/17


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