CORC

在结果中检索

CORC

浏览/检索结果: 共52条，第1-10条 帮助

已选(0)清除 条数/页：   排序方式：
Anomalous annealing of floating gate errors due to heavy ion irradiation 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2018, 卷号: 418, 页码: 80-86
作者:  Hou, Mingdong;  Zhao, Peixiong;  Luo, Jie;  Ji, Qinggang;  Ye, Bing
收藏  |  浏览/下载：55/0  |  提交时间：2018/05/31
Size effect of oxygen reduction reaction on nitrogen-doped graphene quantum dots 期刊论文
RSC ADVANCES, 2018, 卷号: 8, 期号: 1, 页码: 531-536
作者:  Zhang, Peng[1];  Hu, Qiang[2];  Yang, Xuejing[3];  Hou, Xiuli[4];  Mi, Jianli[5]
收藏  |  浏览/下载：7/0  |  提交时间：2019/12/24
First-principles design of bifunctional oxygen reduction and evolution catalysts through bimetallic centers in metal-organic frameworks 期刊论文
CATALYSIS SCIENCE & TECHNOLOGY, 2018, 卷号: 8, 期号: 14, 页码: 3666-3674
作者:  Zhang, Peng[1];  Yang, Xuejing[2];  Gao, Wang[3];  Hou, Xiuli[4];  Mi, Jianli[5]
收藏  |  浏览/下载：7/0  |  提交时间：2019/12/24
Robust H��control of non-cooperative rendezvous based on ��-D method 会议论文
Chinese Intelligent Systems Conference, CISC 2017, Mudanjiang, China, 2017-10-14
作者:  Hou, Mingdong;  Jia, Yingmin
收藏  |  浏览/下载：3/0  |  提交时间：2019/12/30
A comparison of heavy ion induced single event upset susceptibility in unhardened 6T/SRAM and hardened ADE/SRAM 会议论文
作者:  Yan, Weiwei;  Wang, Bin;  Zeng, Chuanbin;  Geng, Chao;  Liu, Tianqi
收藏  |  浏览/下载：40/0  |  提交时间：2018/08/20
Influence of heavy ion flux on single event effect testing in memory devices 会议论文
作者:  Xi, Kai;  Luo, Jie;  Liu, Jie;  Sun, Youmei;  Hou, Mingdong
收藏  |  浏览/下载：16/0  |  提交时间：2018/08/20
Influence of heavy ion flux on single event effect testing in memory devices 会议论文
作者:  Xi, Kai;  Sun, Youmei;  Luo, Jie;  Liu, Jie;  Liu, Tianqi
收藏  |  浏览/下载：18/0  |  提交时间：2018/08/20
A comparison of heavy ion induced single event upset susceptibility in unhardened 6T/SRAM and hardened ADE/SRAM 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2017, 卷号: 406, 页码: 437-442
作者:  Wang, Bin;  Zeng, Chuanbin;  Geng, Chao;  Liu, Tianqi;  Khan, Maaz
收藏  |  浏览/下载：35/0  |  提交时间：2018/05/31
Influence of heavy ion flux on single event effect testing in memory devices 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2017, 卷号: 406, 页码: 431-436
作者:  Luo, Jie;  Liu, Jie;  Sun, Youmei;  Hou, Mingdong;  Xi, Kai
收藏  |  浏览/下载：11/0  |  提交时间：2018/05/31

©版权所有 ©2017 CSpace - Powered by CSpace