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Total Ionizing Dose Responses of Forward Body Bias Ultra-Thin Body and Buried Oxide FD-SOI Transistors 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2019, 卷号: 66, 期号: 4, 页码: 702-709
作者:  Zheng, QW (Zheng, Qiwen)[ 1 ];  Cui, JW (Cui, Jiangwei)[ 1 ];  Xu, LW (Xu, Liewei)[ 2 ];  Ning, BX (Ning, Bingxu)[ 3 ];  Zhao, K (Zhao, Kai)[ 3 ]
收藏  |  浏览/下载：98/0  |  提交时间：2019/05/14
An Effective Method to Compensate Total Ionizing Dose-Induced Degradation on Double-SOI Structure 会议论文
作者:  Huang, Yang;  Li, Binhong;  Zhao, Xing;  Zheng, Zhongshan;  Gao, Jiantou
收藏  |  浏览/下载：16/0  |  提交时间：2019/11/26
Oxygen Adsorption Effect of Amorphous InGaZnO Thin-Film Transistors 期刊论文
IEEE ELECTRON DEVICE LETTERS, 2017
Zhou, Xiaoliang; Shao, Yang; Zhang, Letao; Xiao, Xiang; Han, Dedong; Wang, Yi; Zhang, Shengdong
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
Indium-Tin-Oxide Thin-Film Transistors With In Situ Anodized Ta2O5 Passivation Layer 期刊论文
IEEE ELECTRON DEVICE LETTERS, 2016
Le, Yong; Shao, Yang; Xiao, Xiang; Xu, Xin; Zhang, Shengdong
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
Investigation into sand mura effects of a-IGZO TFT LCDs 期刊论文
MICROELECTRONICS RELIABILITY, 2016
Liu, Xiang; Hu, Hehe; Ning, Ce; Shang, Guangliang; Yang, Wei; Wang, Ke; Lu, Xinhong; Lee, Woobong; Wang, Gang; Xue, Jianshe; Jun, Jung Mok; Zhang, Shengdong
收藏  |  浏览/下载：7/0  |  提交时间：2017/12/03
AN EXPERIMENTAL AND ANALYTICAL METHOD TO OBSERVE THE POLYSILICON NANOWIRE MOSFET THRESHOLD VOLTAGE 其他
2016-01-01
Sheu, Gene; Yang, Shao-Ming; Aanand; Imam, Syed Sarwar; Jen, Fan Ming; Lu, Shao Wei
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
Low Power High Performance FinFET Standard Cells Based on Mixed Back Biasing Technology 期刊论文
IEICE TRANSACTIONS ON ELECTRONICS, 2016
Wang, Tian; Cui, Xiaoxin; Liao, Kai; Liao, Nan; Cui, Xiaole; Yu, Dunshan
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/04
Back Channel Anodization Amorphous Indium Gallium Zinc Oxide Thin-Film Transistors Process 期刊论文
ieee electron device letters, 2015
Xiao, Xiang; Shao, Yang; He, Xin; Deng, Wei; Zhang, Letao; Zhang, Shengdong
收藏  |  浏览/下载：4/0  |  提交时间：2015/11/11
Performance and Stability Improvements of Back-Channel-Etched Amorphous Indium-Gallium-Zinc Thin-Film-Transistors by CF4+O-2 Plasma Treatment 期刊论文
IEEE ELECTRON DEVICE LETTERS, 2015
Liu, Xiang; Wang, Lisa Ling; Hu, Hehe; Lu, Xinhong; Wang, Ke; Wang, Gang; Zhang, Shengdong
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
Employing the mixed FBB/RBB in the design of FinFET logic gates 其他
2015-01-01
Wang, Tian; Cui, Xiaoxin; Liao, Kai; Liao, Nan; Ni, Yewen; Yu, Dunshan; Cui, Xiaole
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03

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