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科研机构
大连理工大学 [16]
金属研究所 [3]
华南理工大学 [2]
上海大学 [1]
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期刊论文 [14]
会议论文 [7]
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Temperature Gradient Induced Orientation Change of Bi Grains in Sn-Bi57-Ag0.7 Solder Joint
期刊论文
ACTA METALLURGICA SINICA-ENGLISH LETTERS, 2022, 页码: 11
作者:
Chen, Yinbo
;
Gao, Zhaoqing
;
Liu, Zhi-Quan
收藏
  |  
浏览/下载:10/0
  |  
提交时间:2022/07/01
Sn-Bi-Ag solder
Grain orientation
Temperature gradient
Aging
Ag3Sn
The open-pin failure of power device under the combined effect of thermo-migration and electro-migration
期刊论文
Chinese Science Bulletin, 2020, 卷号: 65, 期号: 20, 页码: 2169-2177
作者:
Gao Liyin
;
Li Caifu
;
Cao Lihua
;
Liu Zhiquan
收藏
  |  
浏览/下载:15/0
  |  
提交时间:2021/02/03
Failure behavior of flip chip solder joint under coupling condition of thermal cycling and electrical current
期刊论文
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2018, 卷号: 29, 期号: 6, 页码: 5025-5033
作者:
Zhu, QS
;
Gao, F
;
Ma, HC
;
Liu, ZQ
;
Guo, JD
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  |  
浏览/下载:20/0
  |  
提交时间:2018/06/05
Stress-relaxation
Void Formation
Electromigration
Reliability
Sn
Interconnections
Thermomigration
Metallization
Mechanisms
Diffusion
In situ study on the effect of Cu5Zn8 intermetallic layer on the Cu-Ni cross interaction in Cu/Sn-9Zn/Ni interconnect under temperature gradient
期刊论文
MATERIALS CHEMISTRY AND PHYSICS, 2018, 卷号: 216, 页码: 130-135
作者:
Zhong, Y.
;
Zhao, N.
;
Dong, W.
;
Wang, Y. P.
;
Ma, H. T.
收藏
  |  
浏览/下载:8/0
  |  
提交时间:2019/12/02
Synchrotron radiation
Thermomigration
Solder interconnect
Cross-interaction
Intermetallic layer
Formation mechanism of a cathodic serrated interface and voids under high current density
期刊论文
MATERIALS LETTERS, 2018, 卷号: 211, 页码: 191-194
作者:
Zhang, Z. H.[1,2]
;
Cao, H. J.[3]
;
Chen, H. T.[4]
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  |  
浏览/下载:5/0
  |  
提交时间:2019/04/22
Diffusion
Interfaces
Electromigration
Thermomigration
Solder
Intermetallic compound
Abnormal Intermetallic Compound Evolution in Ni/Sn/Ni and Ni/Sn-9Zn/Ni Micro Solder Joints Under Thermomigration
期刊论文
JOURNAL OF ELECTRONIC MATERIALS, 2017, 卷号: 46, 页码: 1931-1936
作者:
Zhao, N.
;
Deng, J. F.
;
Zhong, Y.
;
Huang, M. L.
;
Ma, H. T.
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  |  
浏览/下载:3/0
  |  
提交时间:2019/12/02
Soldering
thermomigration
interfacial reaction
intermetallic compound
Sn-9Zn
dissolution
Retardation of thermomigration-induced Cu substrate consumption in Pb-free solder joints by Zn addition
期刊论文
JOURNAL OF ALLOYS AND COMPOUNDS, 2017, 卷号: 695, 页码: 1436-1443
作者:
Zhong, Y.
;
Zhao, N.
;
Ma, H. T.
;
Dong, W.
;
Huang, M. L.
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2019/12/02
Thermomigration
Synchrotron radiation
Temperature gradient
Interfacial reaction
Zn addition
Dissolution
Coupling effect of thermomigration and cross-interaction on evolution of intermetallic compounds in Cu/Sn/Ni ultrafine interconnects undergoing TLP bonding
期刊论文
JOURNAL OF MATERIALS RESEARCH, 2017, 卷号: 32, 页码: 3128-3136
作者:
Zhong, Yi
;
Zhao, Ning
;
Dong, Wei
;
Ma, Haitao
;
Huang, Mingliang
收藏
  |  
浏览/下载:11/0
  |  
提交时间:2019/12/03
Coupling effect of thermomigration and cross-interaction on evolution of intermetallic compounds in Cu/Sn/Ni ultrafine interconnects undergoing TLP bonding
期刊论文
JOURNAL OF MATERIALS RESEARCH, 2017, 卷号: 32, 页码: 3128-3136
作者:
Zhong, Yi[1]
;
Zhao, Ning[2]
;
Dong, Wei[3]
;
Ma, Haitao[4]
;
Huang, Mingliang[5]
收藏
  |  
浏览/下载:7/0
  |  
提交时间:2019/04/24
Low temperature Ni/Sn/Ni transient liquid phase bonding for high temperature packaging applications by imposing temperature gradient
会议论文
2017 IEEE 67TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2017), 2017-01-01
作者:
Zhong, Y.
;
Zhao, N.
;
Ma, H. T.
;
Dong, W.
;
Huang, M. L.
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2019/12/09
High-temperature electronic packaging
in situ observation
transient liquid phase bonding
thermomigration
intermetallic compound
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