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浏览/检索结果: 共2条，第1-2条 帮助 已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Preliminary single event effect distribution investigation on 28 nm soc using heavy ion microbeam 期刊论文 Nuclear instruments & methods in physics research section b-beam interactions with materials and atoms, 2019, 卷号: 450, 页码: 323-326 作者:  Yang, Weitao;  Du, Xuecheng;  Guo, Jinlong;  Wei, Junze;  Du, Guanghua 收藏  |  浏览/下载：113/0  |  提交时间：2019/10/08 Single event effect (see)  System on chip (soc)  Heavy ion microbeam  On-chip-memory (ocm)   Preliminary single event effect distribution investigation on 28 nm SoC using heavy ion microbeam 期刊论文 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2019, 卷号: 450, 页码: 323-326 作者:  Yang, Weitao;  Du, Xuecheng;  Guo, Jinlong;  Wei, Junze;  Du, Guanghua 收藏  |  浏览/下载：72/0  |  提交时间：2019/11/10 Single event effect (SEE)  System on Chip (SoC)  Heavy ion microbeam  On-chip-memory (OCM)