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Impact of Indentation on the Performance of MgB2 Round Wire 期刊论文
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2017, 卷号: 27, 期号: 4, 页码: 6200604
作者:  Dai, Chao;  Qin, Jinggang;  Liu, Bo;  Liu, Peihang;  Wu, Yu
收藏  |  浏览/下载：211/0  |  提交时间：2018/05/02
星用纳米MOS器件的总剂量辐射效应与NBTI效应研究 学位论文
硕士, 北京: 中国科学院大学, 2016
作者:  余德昭
收藏  |  浏览/下载：33/0  |  提交时间：2016/09/27
CoreRank: Redeeming "Sick Silicon" by Dynamically Quantifying Core-Level Healthy Condition 期刊论文
IEEE TRANSACTIONS ON COMPUTERS, 2016, 卷号: 65, 期号: 3, 页码: 716-729
作者:  Yan, Guihai;  Sun, Faqiang;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：49/0  |  提交时间：2019/12/13
Effect of SiO2 Buffer Layer Thickness on Performance and Reliability of Flexible Polycrystalline Silicon TFTs Fabricated on Polyimide 期刊论文
IEEE ELECTRON DEVICE LETTERS, 2016
Chen, Bo-Wei; Chang, Ting-Chang; Hung, Yu-Ju; Huang, Shin-Ping; Chen, Hua-Mao; Huang, Hui-Chun; Liao, Po-Yung; Chiang, Hsiao-Cheng; Zheng, Yu-Zhe; Yeh, Wei-Heng; Lin, Yu-Ho; Liang, Jonathan Siher; Chu, Ann-Kuo; Li, Hung-Wei; Tsai, Chih-Hung; Lu, Hsueh-Hsing
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
Characterization of Self-heating Leads to Universal Scaling of HCI Degradation of Multi-Fin SOI FinFETs 其他
2016-01-01
Jiang, Hai; Shin, SangHoon; Liu, Xiaoyan; Zhang, Xing; Alam, Muhammad Ashraful
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
On the Assessment of End-of-Life Variability induced by Stochastic NBTI in Nanoscale MOSFETs Accompanying Conspicuous RTN 其他
2016-01-01
Tao Sun; Runsheng Wang; Pengpeng Ren; Xiaobo Jiang; Ru Huang
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
Effects of cold-treatment and strain-rate on mechanical properties of NbTi/Cu superconducting composite wires 期刊论文
SPRINGERPLUS, 2015, 卷号: 4, 页码: 7
作者:  Guan, Mingzhi;  Wang, Xingzhe;  Zhou, Youhe
收藏  |  浏览/下载：18/0  |  提交时间：2018/05/31
Accelerated Aging in Analog and Digital Circuits With Feedback 期刊论文
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2015
Sutaria, Ketul B.; Mohanty, Abinash; Wang, Runsheng; Huang, Ru; Cao, Yu
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
Self-heating Enhanced HCI Degradation in pLDMOSFETs 其他
2015-01-01
He, Yandong; Zhang, Ganggang; Zhang, Xing
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
New insights into the design for end-of-life variability of NBTI in scaled high-��/metal-gate Technology for the nano-reliability era 其他
2015-01-01
Ren, Pengpeng; Wang, Runsheng; Ji, Zhigang; Hao, Peng; Jiang, Xiaobo; Guo, Shaofeng; Luo, Mulong; Duan, Meng; Zhang, Jian F.; Wang, Jianping; Liu, Jinhua; Bu, Weihai; Wu, Jingang; Wong, Waisum; Yu, Shaofeng; Wu, Hanming; Lee, Shiuh-Wuu; Xu, Nuo; Huang, Ru
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03

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