CoreRank: Redeeming "Sick Silicon" by Dynamically Quantifying Core-Level Healthy Condition

doi:10.1109/TC.2015.2479619

CORC > 计算技术研究所 > 中国科学院计算技术研究所 > 中国科学院计算技术研究所期刊论文 > 英文

	CoreRank: Redeeming "Sick Silicon" by Dynamically Quantifying Core-Level Healthy Condition
	Yan, Guihai; Sun, Faqiang; Li, Huawei; Li, Xiaowei
刊名	IEEE TRANSACTIONS ON COMPUTERS
	2016-03-01
卷号	65 期号:3 页码:716-729
关键词	Reliability heterogeneity healthy condition manycore processor
ISSN号	0018-9340
DOI	10.1109/TC.2015.2479619
英文摘要	In field degradation of manycore processors poses a grand challenge to core management, largely because the degradation is hard to quantify. We propose a novel core-level degradation quantification scheme, CoreRank, to facilitate the management. We first develop a new degradation metric, called "healthy condition", to capture the implication of performance degradation of a core with specific degraded components. Then, we propose a performance sampling scheme by using micro-operation streams, called snippet, to statistically quantify cores' healthy condition. We find that similar snippets exhibit stable performance distribution, which makes them ideal micro-benchmarks to testify the core-level healthy conditions. We develop a hardware-implemented version of CoreRank based on bloom filter and hash table. Unlike the traditional "faulty" or "fault-free" judgement, CoreRank provides a key facility to make better use of those imperfect cores that suffered from various progressive aging mechanisms such as NBTI, HCI. Experimental results show that CoreRank successfully hides significant performance degradation of a defective manycore processor in which even more than half of the cores are salvaged from various defects.
资助项目	National Basic Research Program of China (973)[2011CB302503] ; NSFC[61221062] ; NSFC[61376043] ; NSFC[61432017] ; NSFC[61572470] ; NSFC[61532017]
WOS研究方向	Computer Science ; Engineering
语种	英语
出版者	IEEE COMPUTER SOC
WOS记录号	WOS:000370729600005
内容类型	期刊论文
源URL	[http://119.78.100.204/handle/2XEOYT63/8778]
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Yan, Guihai; Sun, Faqiang; Li, Huawei; Li, Xiaowei
作者单位	Chinese Acad Sci, Inst Comp Technol, State Key Lab Comp Architecture, Beijing 100190, Peoples R China
推荐引用方式 GB/T 7714	Yan, Guihai,Sun, Faqiang,Li, Huawei,et al. CoreRank: Redeeming "Sick Silicon" by Dynamically Quantifying Core-Level Healthy Condition[J]. IEEE TRANSACTIONS ON COMPUTERS,2016,65(3):716-729.
APA	Yan, Guihai,Sun, Faqiang,Li, Huawei,&Li, Xiaowei.(2016).CoreRank: Redeeming "Sick Silicon" by Dynamically Quantifying Core-Level Healthy Condition.IEEE TRANSACTIONS ON COMPUTERS,65(3),716-729.
MLA	Yan, Guihai,et al."CoreRank: Redeeming "Sick Silicon" by Dynamically Quantifying Core-Level Healthy Condition".IEEE TRANSACTIONS ON COMPUTERS 65.3(2016):716-729.