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浏览/检索结果: 共9条，第1-9条 帮助 已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Design Criteria and Error Sensitivity of Time-Domain Channel Characterization (TCC) for Asymmetry Fixture De-Embedding 其他 2015-01-01 Yoon, Changwook; Tsiklauri, Mikheil; Zvonkin, Mikhail; Chen, Qinghua Bill; Razmadze, Alexander; Aflaki, Aman; Kim, Jingook; Fan, Jun; Drewniak, James L. 收藏  |  浏览/下载：3/0  |  提交时间：2017/12/04 De-embedding  design criteria  error-coefficient  error sensitivity  insertion loss error-coefficient (ILEC)  return loss error-coefficient (RLEC)  time-domain channel characterization (TCC)   Design Criteria and Error Sensitivity of Time-Domain Channel Characterization (TCC) for Asymmetry Fixture De-Embedding 期刊论文 IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, 2015 Yoon, Changwook; Tsiklauri, Mikheil; Zvonkin, Mikhail; Chen, Qinghua Bill; Razmadze, Alexander; Aflaki, Aman; Kim, Jingook; Fan, Jun; Drewniak, James L. 收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03 De-embedding  design criteria  error-coefficient  error sensitivity  insertion loss error-coefficient (ILEC)  return loss error-coefficient (RLEC)  time-domain channel characterization (TCC)   Measurement of a reciprocal four-port transmission line structure using the 16-term error model 期刊论文 Microwave and optical technology letters, 2007, 卷号: 49, 期号: 7, 页码: 1511-1515 作者:  Zhang, Yun;  Silvonen, Kirnmo;  Zhu, Ning H. 收藏  |  浏览/下载：21/0  |  提交时间：2019/05/12 16-term error model  Four-port  Transmission lines  Calibration  Error sensitivity  Deembedding  Scattering parameters  Test fixture   A 16-term error model based on linear equations of voltage and current variables 期刊论文 Ieee transactions on microwave theory and techniques, 2006, 卷号: 54, 期号: 4, 页码: 1464-1469 作者:  Silvonen, K;  Zhu, NH;  Liu, Y 收藏  |  浏览/下载：29/0  |  提交时间：2019/05/12 Calibration  Deembedding  Error model  15 term  Four-port  Network analyzer  Parasitic  Scattering parameter  16 term   A 16-term error model based on linear equations of voltage and current variables 期刊论文 ieee transactions on microwave theory and techniques, 2006, 卷号: 54, 期号: 4, 页码: 1464-1469 Silvonen K; Zhu NH; Liu Y 收藏  |  浏览/下载：54/0  |  提交时间：2010/04/11 calibration  deembedding  error model  15 term  four-port  network analyzer  parasitic  scattering parameter  16 term  NETWORK-ANALYZER CALIBRATION  SCATTERING-PARAMETER  LOAD IMPEDANCES  LEAKAGE ERRORS  COMPLEX SOURCE  T-PARAMETERS  S-PARAMETERS  CONVERSIONS  DEVICES  ABCD   An improved tm method for full two-port calibration of the asymmetric test fixtures 期刊论文 Microwave and optical technology letters, 2005, 卷号: 45, 期号: 5, 页码: 438-441 作者:  Zhu, NH;  Liu, C;  Pun, EYB;  Chung, PS 收藏  |  浏览/下载：15/0  |  提交时间：2019/05/12 Calibration  Deembedding  Microwave network analyzer  Test fixtures  Scattering parameter measurement   Scaled model measurement of the embedding impedance of a 660-GHz waveguide SIS mixer with a 3-standard deembedding method 期刊论文 IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, 2003, 卷号: 13, 期号: 9, 页码: 376-378 作者:  Zhang, W;  Tong, CYE;  Shi, SC 收藏  |  浏览/下载：14/0  |  提交时间：2012/08/08 deembedding method  embedding impedance  scaled model  SIS mixer  time domain gating   Frequency limitation in the calibration of microwave test fixtures 期刊论文 Ieee transactions on microwave theory and techniques, 2003, 卷号: 51, 期号: 9, 页码: 2000-2006 作者:  Zhu, NH;  Qian, C;  Wang, YL;  Pun, EYB;  Chung, PS 收藏  |  浏览/下载：19/0  |  提交时间：2019/05/12 Calibration  Deembedding  Microwave network analyzer  Scattering parameter measurement  Test fixture   Frequency limitation in the calibration of microwave test fixtures 期刊论文 ieee transactions on microwave theory and techniques, 2003, 卷号: 51, 期号: 9, 页码: 2000-2006 Zhu NH; Qian C; Wang YL; Pun EYB; Chung PS 收藏  |  浏览/下载：31/0  |  提交时间：2010/08/12 calibration  deembedding  microwave network analyzer  scattering parameter measurement  test fixture  NETWORK-ANALYZER CALIBRATION