Frequency limitation in the calibration of microwave test fixtures | |
Zhu, NH; Qian, C; Wang, YL; Pun, EYB; Chung, PS | |
刊名 | Ieee transactions on microwave theory and techniques
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2003-09-01 | |
卷号 | 51期号:9页码:2000-2006 |
关键词 | Calibration Deembedding Microwave network analyzer Scattering parameter measurement Test fixture |
ISSN号 | 0018-9480 |
DOI | 10.1109/tmtt.20032.815871 |
通讯作者 | Zhu, nh() |
英文摘要 | The problem of frequency limitation arising from the calibration of asymmetric and symmetric test fixtures has been investigated. for asymmetric test fixtures, a new algorithm based on the thru-short-match (tsm) method is outlined. it is found that the conventional tsm method does not have any inherent frequency limitation, but using the same procedure with an unknown match may lead to the said problem. this limitation can be avoided by using a different algorithm. the various calibration methods for symmetric test fixtures using known standards are also discussed and the origin of the frequency limitation is identified. several ways in avoiding the problem are proposed. there is good agreement between the theories and experimental data. |
WOS关键词 | NETWORK-ANALYZER CALIBRATION |
WOS研究方向 | Engineering |
WOS类目 | Engineering, Electrical & Electronic |
语种 | 英语 |
出版者 | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
WOS记录号 | WOS:000184789400003 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/2429382 |
专题 | 半导体研究所 |
通讯作者 | Zhu, NH |
作者单位 | 1.Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China 2.Univ Hong Kong, Dept Elect Engn, Kowloon, Hong Kong, Peoples R China |
推荐引用方式 GB/T 7714 | Zhu, NH,Qian, C,Wang, YL,et al. Frequency limitation in the calibration of microwave test fixtures[J]. Ieee transactions on microwave theory and techniques,2003,51(9):2000-2006. |
APA | Zhu, NH,Qian, C,Wang, YL,Pun, EYB,&Chung, PS.(2003).Frequency limitation in the calibration of microwave test fixtures.Ieee transactions on microwave theory and techniques,51(9),2000-2006. |
MLA | Zhu, NH,et al."Frequency limitation in the calibration of microwave test fixtures".Ieee transactions on microwave theory and techniques 51.9(2003):2000-2006. |
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