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科研机构
半导体研究所 [16]
内容类型
期刊论文 [16]
发表日期
2011 [2]
2010 [1]
2009 [2]
2008 [2]
2003 [2]
2002 [2]
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半导体材料 [16]
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Fabrication and property investigation of the highly ordered TiO2 nanotube arrays
期刊论文
gao xiao hua xue gong cheng xue bao/journal of chemical engineering of chinese universities, 2011, 卷号: 25, 期号: 3, 页码: 507-512
Lan, Yu-Wei
;
Zhou, Li-Ya
;
Tong, Zhang-Fa
;
Pang, Qi
;
Leng, Li-Min
;
Han, Jian-Peng
;
Wang, Fan
收藏
  |  
浏览/下载:20/0
  |  
提交时间:2012/06/14
Anodic oxidation
Azo dyes
Degradation
Ethylene
Ethylene glycol
Fabrication
Mercury(metal)
Photocatalysis
Photodegradation
Scanning electron microscopy
Titanium
Titanium dioxide
X ray diffraction
X ray diffraction analysis
Structures and optical characteristics of InGaN quantum dots grown by MBE
期刊论文
xiyou jinshu cailiao yu gongcheng/rare metal materials and engineering, 2011, 卷号: 40, 期号: 11, 页码: 2030-2032
Wang, Baozhu
;
Yan, Cuiying
;
Wang, Xiaoliang
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  |  
浏览/下载:22/0
  |  
提交时间:2012/06/14
Atomic force microscopy
Gallium nitride
Molecular beam epitaxy
Optical materials
Optical properties
Reflection high energy electron diffraction
Sapphire
Substrate temperature dependence of ZnTe epilayers grown on GaAs(001) by molecular beam epitaxy
期刊论文
journal of crystal growth, 2010, 卷号: 312, 期号: 9, 页码: 1491-1495
Zhao J (Zhao Jie)
;
Zeng YP (Zeng Yiping)
;
Liu C (Liu Chao)
;
Li YB (Li Yanbo)
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  |  
浏览/下载:148/33
  |  
提交时间:2010/06/04
Reflection high-energy electron diffraction
Atomic force microscopy
Molecular beam epitaxy
Zinc compounds
Semiconducting II-VI materials
Growth behavior of AlInGaN films
期刊论文
journal of crystal growth, 2009, 卷号: 311, 期号: 3, 页码: 474-477
Shang JZ
;
Zhang BP
;
Mao MH
;
Cai LE
;
Zhang JY
;
Fang ZL
;
Liu BL
;
Yu JZ
;
Wang QM
;
Kusakabe K
;
Ohkawa K
收藏
  |  
浏览/下载:216/66
  |  
提交时间:2010/03/08
Scanning electron microscope
Strain
X-ray diffraction
AlInGaN
Improvement in crystal quality of ZnO film on Si substrate by using a homo-buffer layer
期刊论文
materials science in semiconductor processing, 2009, 卷号: 12, 期号: 6, 页码: 233-237
作者:
Zhao J
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  |  
浏览/下载:43/4
  |  
提交时间:2011/07/05
ZnO
Pulsed laser deposition
X-ray diffraction
Photoluminescence
Reflection high-energy electron diffraction
PULSED-LASER DEPOSITION
THIN-FILMS
PLD TECHNIQUE
GROWTH
SAPPHIRE
TEMPERATURE
QtUCP-A program for determining unit-cell parameters in electron diffraction experiments using double-tilt and rotation-tilt holders
期刊论文
ultramicroscopy, 2008, 卷号: 108, 期号: 12, 页码: 1540-1545
Zhao HS
;
Wu DQ
;
Yao JC
;
Chang AM
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  |  
浏览/下载:45/0
  |  
提交时间:2010/03/08
Electron diffraction
Effect of Nitridation on Morphology, Structural Properties and Stress of AIN Films
期刊论文
chinese physics letters, 2008, 卷号: 25, 期号: 12, 页码: 4364-4367
作者:
Wei HY
;
Jiao CM
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  |  
浏览/下载:178/45
  |  
提交时间:2010/03/08
TRANSMISSION ELECTRON-MICROSCOPY
WURTZITE-TYPE CRYSTALS
VAPOR-PHASE EPITAXY
INTRINSIC STRESS
SAPPHIRE SURFACE
THIN-FILMS
GAN
GROWTH
DIFFRACTION
MECHANISM
Microstructure of GaN films grown on Si(111) substrates by metalorganic chemical vapor deposition
期刊论文
journal of crystal growth, 2003, 卷号: 256, 期号: 3-4, 页码: 416-423
Hu GQ
;
Kong X
;
Wan L
;
Wang YQ
;
Duan XF
;
Lu Y
;
Liu XL
收藏
  |  
浏览/下载:25/0
  |  
提交时间:2010/08/12
amorphous layer
dislocation
transmission electron microscopy
metalorganic chemical vapor deposition
GaN
MOLECULAR-BEAM EPITAXY
HIGH-QUALITY GAN
HETEROEPITAXIAL GROWTH
ELECTRON-DIFFRACTION
DEFECT STRUCTURE
HETEROSTRUCTURE
DISLOCATIONS
MICROSCOPY
(111)SI
LAYER
Selective area growth of GaN on GaAs(001) substrates by metalorganic vapor-phase epitaxy
期刊论文
journal of crystal growth, 2003, 卷号: 252, 期号: 1-3, 页码: 9-13
Shen XM
;
Feng G
;
Zhang BS
;
Duan LH
;
Wang YT
;
Yang H
收藏
  |  
浏览/下载:38/0
  |  
提交时间:2010/08/12
scanning electron microscopy
X-ray diffraction
Metalorganic vapor phase epitaxy
selective area growth
gallium nitride
CUBIC GAN
OVERGROWN GAN
DEPOSITION
GAAS(100)
GdxSi grown with mass-analyzed low energy dual ion beam epitaxy technique
期刊论文
journal of crystal growth, 2002, 卷号: 242, 期号: 3-4, 页码: 389-394
Zhou JP
;
Chen NF
;
Zhang FQ
;
Song SL
;
Chai CL
;
Yang SY
;
Liu ZK
;
Lin LY
收藏
  |  
浏览/下载:54/0
  |  
提交时间:2010/08/12
Auger electron spectroscopy
X-ray diffraction
X-ray photoelectron spectroscopy
ion beam epitaxy
semiconducting gadolinium silicide
SEMICONDUCTING SILICIDES
MAGNETIC SEMICONDUCTORS
TRANSITION
INSULATOR
SILICON
FILMS
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