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CORC

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Adding the missing time-dependent layout dependency into device-circuit-layout co-optimization-New findings on the layout dependent aging effects 其他
2016-01-01
Ren, Pengpeng; Xu, Xiaoqing; Hao, Peng; Wang, Junyao; Wang, Runsheng; Li, Ming; Wang, Jianping; Bu, Weihai; Wu, Jingang; Wong, Waisum; Yu, Shaofeng; Wu, Hanming; Lee, Shiuh-Wuu; Pan, David Z.; Huang, Ru
收藏  |  浏览/下载：11/0  |  提交时间：2017/12/03
Layout dependent BTI and HCI degradation in nano CMOS technology: A new time-dependent LDE and impacts on circuit at end of life 其他
2016-01-01
Ren, Pengpeng; Wang, Runsheng; Huang, Ru
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
Too Noisy at the Nanoscale?-The Rise of Random Telegraph Noise (RTN) in Devices and Circuits 其他
2016-01-01
Wang, Runsheng; Guo, Shaofeng; Ren, Pengpeng; Luo, Mulong; Zou, Jibin; Hang, Ru
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
On the Assessment of End-of-Life Variability induced by Stochastic NBTI in Nanoscale MOSFETs Accompanying Conspicuous RTN 其他
2016-01-01
Tao Sun; Runsheng Wang; Pengpeng Ren; Xiaobo Jiang; Ru Huang
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
On the Frequency Dependence of Oxide Trap Coupling in Nanoscale MOSFETs: Understanding based on Complete 4-State Trap Model 其他
2016-01-01
Peng Hao; Dongyuan Mao; Runsheng Wang; Shaofeng Guo; Pengpeng Ren; Ru Huang
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
Duty Cycle Shift under Static/Dynamic Aging in 28nm HK-MG Technology 其他
2015-01-01
Sutaria, Ketul B.; Ren, Pengpeng; Mohanty, Abinash; Feng, Xixiang; Wang, Runsheng; Huang, Ru; Cao, Yu
收藏  |  浏览/下载：7/0  |  提交时间：2017/12/03
New insights into the design for end-of-life variability of NBTI in scaled high-��/metal-gate Technology for the nano-reliability era 其他
2015-01-01
Ren, Pengpeng; Wang, Runsheng; Ji, Zhigang; Hao, Peng; Jiang, Xiaobo; Guo, Shaofeng; Luo, Mulong; Duan, Meng; Zhang, Jian F.; Wang, Jianping; Liu, Jinhua; Bu, Weihai; Wu, Jingang; Wong, Waisum; Yu, Shaofeng; Wu, Hanming; Lee, Shiuh-Wuu; Xu, Nuo; Huang, Ru
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
New understanding of state-loss in complex RTN: Statistical experimental study, trap interaction models, and impact on circuits 其他
2015-01-01
Zou, Jibin; Wang, Runsheng; Guo, Shaofeng; Luo, Mulong; Yu, Zhuoqing; Jiang, Xiaobo; Ren, Pengpeng; Wang, Jianping; Liu, Jinhua; Wu, Jingang; Wong, Waisum; Yu, Shaofeng; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan; Huang, Ru
收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03
DTMOS mode as an effective solution of RTN suppression for robust device/circuit co-design 其他
2015-01-01
Guo, Shaofeng; Huang, Ru; Hao, Peng; Luo, Mulong; Ren, Pengpeng; Wang, Jianping; Bu, Weihai; Wu, Jingang; Wong, Waisum; Yu, Scott; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Runsheng; Wang, Yangyuan
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
New Framework for the random charging/discharging of oxide traps in HfO2 gate dielectric: Ab-initio simulation and experimental evidence 其他
2015-01-01
Ji, Jingwei; Qiu, Yingxin; Guo, Shaofeng; Wang, Runsheng; Ren, Pengpeng; Hao, Peng; Huang, Ru
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03

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