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	Duty Cycle Shift under Static/Dynamic Aging in 28nm HK-MG Technology
	Sutaria, Ketul B. ; Ren, Pengpeng ; Mohanty, Abinash ; Feng, Xixiang ; Wang, Runsheng ; Huang, Ru ; Cao, Yu
	2015
关键词	Aging NBTI PBTI Duty Cycle Shift BTI
英文摘要	Aging due to bias-temperature-instability (BTI) is the dominant cause of functional failure in large scale logic circuits. Power efficient techniques such as clock gating or dynamic voltage scaling exacerbate the problem of asymmetric aging. Traditional analysis on synchronous circuits focuses on shift in data path delay and neglects the change in duty cycle. This work highlights the impact of NBTI and PBTI at advanced technology node on duty cycle shift which is important for edge triggered designs, such as latch based circuits. The contributions of this work are: (1) characterization, decoupling and model calibration of NBTI, PBTI and CHC data at 28nm HK-MG technology; (2) demonstration of monotonic shift of duty cycle under static stress condition and non-monotonic shift under dynamic stress, in which duty cycle converges to 50%. Additional PBTI component at 28nm HK-MG causes faster shift in duty cycle compared to conventional NBTI aging; (3) the sensitivity of long-term aging to the ratio between static and dynamic stress conditions. With PBTI, duty cycle shift is effectively reduced by dynamic stress.; EI; CPCI-S(ISTP); CA71-CA75; 2015-May
语种	英语
出处	2015 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS)
DOI标识	10.1109/IRPS.2015.7112785
内容类型	其他
源URL	[http://ir.pku.edu.cn/handle/20.500.11897/423406]
专题	信息科学技术学院
推荐引用方式 GB/T 7714	Sutaria, Ketul B.,Ren, Pengpeng,Mohanty, Abinash,et al. Duty Cycle Shift under Static/Dynamic Aging in 28nm HK-MG Technology. 2015-01-01.

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