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Failure Analysis and Improvement of the Body Diode in Superjunction Power MOSFET 会议论文
2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapore, Singapore, 2018
作者:  Min Ren;  Mengqi Yang;  Shengrong Zhong;  Chi Xie;  Zehong Li
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