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| When LPWAN Meets ITS: Evaluation of Low Power Wide Area Networks for V2X Communications 会议论文 Maui, Hawaii, USA,, November 4-7, 2018 作者: Li YK(李玉珂) ; Linyao Yang; Shuangshuang Han ; Xiao Wang ; Fei-Yue Wang![](/image/person.jpg)
![](/themes/default/image/downing1.png) 收藏  |  浏览/下载:44/0  |  提交时间:2019/04/21
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| A Teacher-Student Framework for Maintainable Dialog Manager 会议论文 布鲁塞尔, 2018-11 作者: Wang, Weikang; Zhang, Jiajun; Zhang, Han; Hwang, Mei-Yuh; Zong, Chengqing
![](/themes/default/image/downing1.png) 收藏  |  浏览/下载:15/0  |  提交时间:2020/06/10 |
| A Base Resistance Controlled Thyristor with N-type Buried Layer to Suppress the Snapback Phenomenon 会议论文 作者: Hu F(胡飞); Song LM(宋李梅) ; Li B(李博) ; Wang LX(王立新) ; Luo JJ(罗家俊)![](/image/person.jpg)
![](/themes/default/image/downing1.png) 收藏  |  浏览/下载:28/0  |  提交时间:2019/05/13 |
| Investigation of the relationship between the total dose effect and thickness of Al2O3 gate dielectric under gamma-ray irradiation 会议论文 作者: Li DL(李多力) ; Zhu HP(朱慧平) ; Chen X(陈曦); Zheng ZS(郑中山) ; Li B(李博)![](/image/person.jpg)
![](/themes/default/image/downing1.png) 收藏  |  浏览/下载:23/0  |  提交时间:2019/05/13 |
| Correlation between the Decoupling Capacitor Layouts and Single-Event-Upset Resistances of SRAM cells 会议论文 作者: Zhentao Li; Zheng ZS(郑中山) ; Zhao K(赵凯); Li B(李博) ; Luo JJ(罗家俊)![](/image/person.jpg)
![](/themes/default/image/downing1.png) 收藏  |  浏览/下载:22/0  |  提交时间:2019/05/13 |
| Total dose effects of 28nm FD-SOI CMOS transistors 会议论文 作者: Kuang Y(匡勇); Bu JH(卜建辉) ; Li B(李博) ; Gao LC(高林春) ; Liang CP(梁春平)
![](/themes/default/image/downing1.png) 收藏  |  浏览/下载:26/0  |  提交时间:2019/05/10 |
| A low leakage current Tunneling-FET based on SOI 会议论文 作者: Bu JH(卜建辉) ; Li DL(李多力) ; Xu GB(许高博) ; Cai XW(蔡小五) ; Kuang Y(匡勇)
![](/themes/default/image/downing1.png) 收藏  |  浏览/下载:35/0  |  提交时间:2019/05/13 |
| Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment 会议论文 作者: Li BH(李彬鸿) ; Huang Y(黄杨) ; J.Wu; Huang YB(黄云波); Li B(李博)![](/image/person.jpg)
![](/themes/default/image/downing1.png) 收藏  |  浏览/下载:36/0  |  提交时间:2019/05/13 |
| Process variation dependence of total ionizing dose effects in bulk nFinFETs 会议论文 作者: Li B(李博) ; Huang YB(黄云波); L.Yang; Zhang QZ(张青竹) ; Zheng ZS(郑中山)![](/image/person.jpg)
![](/themes/default/image/downing1.png) 收藏  |  浏览/下载:46/0  |  提交时间:2019/05/13 |
| Radiation and Annealing Characteristics of Interface traps in SOI NMOSFETs by the Direct-Current Current-Voltage Technique 会议论文 作者: Li YY(李洋洋); Li XJ(李晓静) ; Li B(李博) ; Gao LC(高林春) ; Yan WW(闫薇薇)![](/image/person.jpg)
![](/themes/default/image/downing1.png) 收藏  |  浏览/下载:39/0  |  提交时间:2019/05/09 |