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Theoretical model of the polarization Coulomb field scattering in strained AlGaN/AlN/GaN heterostructure field-effect transistors 期刊论文
Journal of Applied Physics, 2014, 期号: 4, 页码: 044507-1-044507-7
作者:  Chongbiao Luan;  Zhaojun Lin;  Yuanjie Lv;  Jingtao Zhao;  Yutang Wang
收藏  |  浏览/下载:3/0  |  提交时间:2019/12/17
Influence of polarization coulomb field scattering on the subthreshold swing in depletion-mode AlGaN/AlN/GaN heterostructure field-effect transistors 期刊论文
Physica, E. Low-dimensional systems & nanostructures, 2014, 页码: 76-79
作者:  Chongbiao Luan;  Zhaojun Lin;  Yuanjie Lv;  Zhihong Feng;  Jingtao Zhao
收藏  |  浏览/下载:2/0  |  提交时间:2019/12/17
The influence of the AlN barrier thickness on the polarization Coulomb field scattering in AlN/GaN heterostructure field-effect transistors 期刊论文
Journal of Applied Physics, 2014, 期号: 2, 页码: 024504-1-024504-5
作者:  Yuanjie Lv;  Zhihong Feng;  Zhaojun Lin;  Ziwu Ji;  Jingtao Zhao
收藏  |  浏览/下载:8/0  |  提交时间:2019/12/17
The influence of the AlN barrier thickness on the polarization Coulomb field scattering in AlN/GaN heterostructure field-effect transistors 期刊论文
JOURNAL OF APPLIED PHYSICS, 2014, 卷号: 116, 期号: 2
作者:  Lv, Yuanjie;  Feng, Zhihong;  Lin, Zhaojun;  Ji, Ziwu;  Zhao, Jingtao
收藏  |  浏览/下载:2/0  |  提交时间:2019/12/17
Theoretical model of the polarization Coulomb field scattering in strained AlGaN/AlN/GaN heterostructure field-effect transistors 期刊论文
JOURNAL OF APPLIED PHYSICS, 2014, 卷号: 116, 期号: 4
作者:  Luan, Chongbiao;  Lin, Zhaojun;  Lv, Yuanjie;  Zhao, Jingtao;  Wang, Yutang
收藏  |  浏览/下载:2/0  |  提交时间:2019/12/17
Influence of polarization coulomb field scattering on the subthreshold swing in depletion-mode AlGaN/AlN/GaN heterostructure field-effect transistors 期刊论文
PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 2014, 卷号: 62, 页码: 76-79
作者:  Luan, Chongbiao;  Lin, Zhaojun;  Lv, Yuanjie;  Feng, Zhihong;  Zhao, Jingtao
收藏  |  浏览/下载:1/0  |  提交时间:2019/12/17
Effects of rapid thermal annealing on the electrical properties of the AlGaN/AlN/GaN heterostructure field-effect transistors with Ti/Al/Ni/Au gate electrodes 期刊论文
APPLIED PHYSICS LETTERS, 2014, 卷号: 105, 期号: 8
作者:  Zhao, Jingtao;  Lin, Zhaojun;  Luan, Chongbiao;  Zhou, Yang;  Yang, Ming
收藏  |  浏览/下载:4/0  |  提交时间:2019/12/17


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