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Verification of SEU resistance in 65 nm high-performance SRAM with dual DICE interleaving and EDAC mitigation strategies 期刊论文
NUCLEAR SCIENCE AND TECHNIQUES, 2021, 卷号: 32, 期号: 12, 页码: 13
作者:  He, Ze;  Zhao, Shi-Wei;  Liu, Tian-Qi;  Cai, Chang;  Yan, Xiao-Yu
收藏  |  浏览/下载:65/0  |  提交时间:2022/01/12
Design and verification of multiple SEU mitigated circuits on SRAM-based FPGA system 期刊论文
MICROELECTRONICS RELIABILITY, 2021, 卷号: 126, 页码: 7
作者:  Yu, Jian;  Cai, Chang;  Ning, Bingxu;  Gao, Shuai;  Liu, Tianqi
收藏  |  浏览/下载:25/0  |  提交时间:2022/01/24
Measurement and evaluation of the Single Event Effects of high-performance SerDes circuits 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2021, 卷号: 1012, 页码: 11
作者:  Wang, Shu;  Cai, Chang;  Ning, Bingxu;  He, Ze;  Huang, Zhiqin
收藏  |  浏览/下载:18/0  |  提交时间:2021/12/08
Heavy-Ion Induced Single Event Upsets in Advanced 65 nm Radiation Hardened FPGAs 期刊论文
ELECTRONICS, 2019, 卷号: 8, 期号: 3, 页码: 13
作者:  Ke, Lingyun;  Zhao, Peixiong;  Liu, Jie;  Fan, Xue;  Cai, Chang
收藏  |  浏览/下载:108/0  |  提交时间:2019/11/10
Implementation and verification of different ECC mitigation designs for BRAMs in flash-based FPGAs 期刊论文
CHINESE PHYSICS C, 2016, 卷号: 40, 页码: 9
作者:  Yang, Zhen-Lei;  Wang, Xiao-Hui;  Zhang, Zhan-Gang;  Liu, Jie;  Su, Hong
收藏  |  浏览/下载:13/0  |  提交时间:2018/05/31


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