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Impacts of Metastable Defect States on Gate Oxide Trapping in Nanoscale MOS Devices 其他
2016-01-01
Mao, Dongyuan; Guo, Shaofeng; Wang, Runsheng; Huang, Ru; Liu, Changze
收藏  |  浏览/下载：1/0  |  提交时间：2017/12/03
Effect of SiO2 Buffer Layer Thickness on Performance and Reliability of Flexible Polycrystalline Silicon TFTs Fabricated on Polyimide 期刊论文
IEEE ELECTRON DEVICE LETTERS, 2016
Chen, Bo-Wei; Chang, Ting-Chang; Hung, Yu-Ju; Huang, Shin-Ping; Chen, Hua-Mao; Huang, Hui-Chun; Liao, Po-Yung; Chiang, Hsiao-Cheng; Zheng, Yu-Zhe; Yeh, Wei-Heng; Lin, Yu-Ho; Liang, Jonathan Siher; Chu, Ann-Kuo; Li, Hung-Wei; Tsai, Chih-Hung; Lu, Hsueh-Hsing
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
Characterization of Self-heating Leads to Universal Scaling of HCI Degradation of Multi-Fin SOI FinFETs 其他
2016-01-01
Jiang, Hai; Shin, SangHoon; Liu, Xiaoyan; Zhang, Xing; Alam, Muhammad Ashraful
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
On the Assessment of End-of-Life Variability induced by Stochastic NBTI in Nanoscale MOSFETs Accompanying Conspicuous RTN 其他
2016-01-01
Tao Sun; Runsheng Wang; Pengpeng Ren; Xiaobo Jiang; Ru Huang
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
Accelerated Aging in Analog and Digital Circuits With Feedback 期刊论文
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2015
Sutaria, Ketul B.; Mohanty, Abinash; Wang, Runsheng; Huang, Ru; Cao, Yu
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
Duty Cycle Shift under Static/Dynamic Aging in 28nm HK-MG Technology 其他
2015-01-01
Sutaria, Ketul B.; Ren, Pengpeng; Mohanty, Abinash; Feng, Xixiang; Wang, Runsheng; Huang, Ru; Cao, Yu
收藏  |  浏览/下载：7/0  |  提交时间：2017/12/03
Self-heating Enhanced HCI Degradation in pLDMOSFETs 其他
2015-01-01
He, Yandong; Zhang, Ganggang; Zhang, Xing
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
New insights into the design for end-of-life variability of NBTI in scaled high-��/metal-gate Technology for the nano-reliability era 其他
2015-01-01
Ren, Pengpeng; Wang, Runsheng; Ji, Zhigang; Hao, Peng; Jiang, Xiaobo; Guo, Shaofeng; Luo, Mulong; Duan, Meng; Zhang, Jian F.; Wang, Jianping; Liu, Jinhua; Bu, Weihai; Wu, Jingang; Wong, Waisum; Yu, Shaofeng; Wu, Hanming; Lee, Shiuh-Wuu; Xu, Nuo; Huang, Ru
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
New Framework for the random charging/discharging of oxide traps in HfO2 gate dielectric: Ab-initio simulation and experimental evidence 其他
2015-01-01
Ji, Jingwei; Qiu, Yingxin; Guo, Shaofeng; Wang, Runsheng; Ren, Pengpeng; Hao, Peng; Huang, Ru
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
On the origin of frequency dependence of single-trap induced degradation in AC NBTI 其他
2015-01-01
Mao, Dongyuan; Guo, Shaofeng; Wang, Runsheng; Liu, Changze; Huang, Ru
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03

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