QQ客服 官方微博 反馈留言

浏览/检索结果: 共6条，第1-6条 帮助 限定条件 内容类型：会议论文     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Microstructure characterization of lattice defects induced by As ion implantation in HgCdTe epilayers 会议论文 作者:  Shi CZ;  Lin C;  Wei YF;  Chen L 收藏  |  浏览/下载：21/0  |  提交时间：2018/11/20 The influence of sea water corrosion on the resistance cracking performance of carbon steel 会议论文 Beijing, China, June 16, 2013 - June 21, 2013 作者:  Wang LM;  Han DP;  Zhang DH;  Li DY;  Geng H 收藏  |  浏览/下载：17/0  |  提交时间：2018/11/08 Bearing capacity  Crack propagation  Crack tips  Electron microscopes  Seawater corrosion  Steel corrosion  Characteristics parameters  Crack tip opening displacement  Cracking performance  Elasto  plastic  Electron microscopic observations  Fracture behavior  Fracture performance  Microscopic analysis   MPM/MD handshaking method for multiscale simulation and its application to high energy cluster impacts 会议论文 INTERNATIONAL JOURNAL OF MECHANICAL SCIENCES, 7th Asia-Pacific Symposium on Advances in Engineering Plasticity and its Applications, Shanghai, PEOPLES R CHINA, Web of Science Guo, Z; Yang, W 收藏  |  浏览/下载：2/0 Mechanical Behavior of Nanometer Ni by MD Simulation 会议论文 2nd International Symposium on Computational Mechanics, Hong Kong, PEOPLES R CHINA, NOV 30-DEC 03, 2009 作者:  Tang QH(汤奇恒);  Tang QH 收藏  |  浏览/下载：51/0  |  提交时间：2009/07/23 Nanocrystal  Molecular Dynamics Simulation  Indentation  Dislocation  Surface Temperature  Molecular-Dynamics Simulation  Size  Nanoindentation  Nanowires  Scale   Hydrogen behavior in GaN epilayers grown by NH3-MBE 会议论文 11th international conference on molecular beam epitaxy (mbe-xi), beijing, peoples r china, sep 11-15, 2000 Kong MY; Zhang JP; Wang XL; Sun DZ 收藏  |  浏览/下载：12/0  |  提交时间：2010/11/15 impurities  molecular beam epitaxy  nitrides  semiconducting III-V materials  GALLIUM NITRIDE  SAPPHIRE SUBSTRATE  DEFECTS  HETEROSTRUCTURE  SEMICONDUCTORS  STRESS   STUDIES OF POINT-DEFECT DISLOCATION LOOP INTERACTION PROCESSES IN SILICON 会议论文 JONES, KS; ROBINSON, HG; LISTEBARGER, J; CHEN, J; LIU, J; HERNER, B; PARK, H; LAW, ME; SIELOFF, D; SLINKMAN, JA 收藏  |  浏览/下载：5/0  |  提交时间：2015/11/12 ION-IMPLANTED SILICON  RANGE DAMAGE  DIFFUSION  SI  BORON  DETECTORS  GOLD  END