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Characterization of stress induced in SOS and Si/gamma-Al2O3/Si heteroepitaxial thin films by Raman spectroscopy 期刊论文
journal of crystal growth, 2005, 卷号: 280, 期号: 1-2, 页码: 222-226
Wang QY; Wang J; Wang JH; Liu ZL; Lin LY
收藏  |  浏览/下载:43/3  |  提交时间:2010/03/17
Design of spectrometer based on volume phase grating for near infrared range 会议论文
3rd international symposium on instrumentation science and technology, xian, peoples r china, aug 18-22, 2004
Li F; Xin HL; Cao P; Liu YL
收藏  |  浏览/下载:15/1  |  提交时间:2010/10/29


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