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Design and verification of multiple SEU mitigated circuits on SRAM-based FPGA system 期刊论文
MICROELECTRONICS RELIABILITY, 2021, 卷号: 126, 页码: 7
作者:  Yu, Jian;  Cai, Chang;  Ning, Bingxu;  Gao, Shuai;  Liu, Tianqi
收藏  |  浏览/下载:25/0  |  提交时间:2022/01/24
Measurement and evaluation of the Single Event Effects of high-performance SerDes circuits 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2021, 卷号: 1012, 页码: 11
作者:  Wang, Shu;  Cai, Chang;  Ning, Bingxu;  He, Ze;  Huang, Zhiqin
收藏  |  浏览/下载:19/0  |  提交时间:2021/12/08


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