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Influence of Co addition on microstructure evolution and mechanical strength of solder joints bonded with solid-liquid electromigration 期刊论文
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2021, 卷号: 32, 期号: 13, 页码: 17336-17348
作者:  Qiu, Hongyu;  Xu, Han;  Zhang, Chuge;  Hu, Xiaowu;  Jiang, Xiongxin
收藏  |  浏览/下载:18/0  |  提交时间:2021/10/14
Influence of Co addition on microstructure evolution and mechanical strength of solder joints bonded with solid–liquid electromigration 期刊论文
Journal of Materials Science: Materials in Electronics, 2021, 卷号: 32, 期号: 13, 页码: 17336-17348
作者:  Qiu, Hongyu;  Xu, Han;  Zhang, Chuge;  Hu, Xiaowu;  Jiang, Xiongxin
收藏  |  浏览/下载:13/0  |  提交时间:2022/02/17
Electromigration of [C6MIm][TFSI]from Ionic Liquids Bulk to Aqueous Solutions 期刊论文
盐湖研究, 2021, 卷号: 29, 期号: 02, 页码: 35-43
作者:  王明勇;  孙进贺;  张鹏瑞;  黄超驰;  张茜
收藏  |  浏览/下载:3/0  |  提交时间:2022/03/29
Electromigration of [C6MIm][TFSI]from Ionic Liquids Bulk to Aqueous Solutions 期刊论文
盐湖研究, 2021, 卷号: 29, 期号: 02, 页码: 35-43
作者:  王明勇;  孙进贺;  张鹏瑞;  黄超驰;  张茜
收藏  |  浏览/下载:3/0  |  提交时间:2022/11/30


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