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Comparative Study on RTN Amplitude in Planar and FinFET Devices 其他
2017-01-01
Zhang, Zexuan; Zhang, Zhe; Guo, Shaofeng; Wang, Runsheng; Wang, Xingsheng; Cheng, Binjie; Asenov, Asen; Huang, Ru
收藏  |  浏览/下载:5/0  |  提交时间:2017/12/03
Predictive compact modeling of random variations in FinFET technology for 16/14nm node and beyond 其他
2016-01-01
Jiang, Xiaobo; Wang, Xingsheng; Wang, Runsheng; Cheng, Binjie; Asenov, Asen; Huang, Ru
收藏  |  浏览/下载:5/0  |  提交时间:2017/12/03
A Simple Method to Decompose the Amplitudes of Different Random Variation Sources in FinFET Technology 其他
2016-01-01
Jiang, Xiaobo; Wang, Runsheng; Huang, Ru; Wang, Xingsheng; Cheng, Binjie; Asenov, Asen
收藏  |  浏览/下载:1/0  |  提交时间:2017/12/03
New Insights into the Near-Threshold Design in Nanoscale FinFET Technology for Sub-0.2V Applications 其他
2016-01-01
Jiang, Xiaobo; Guo, Shaofeng; Wang, Runsheng; Wang, Yuan; Wang, Xingsheng; Cheng, Binjie; Asenov, Asen; Huang, Ru
收藏  |  浏览/下载:2/0  |  提交时间:2017/12/03
New Approach for Understanding "Random Device Physics" from Channel Percolation Perspectives: Statistical Simulations, Key Factors and Experimental Results 其他
2016-01-01
Zhang, Zhe; Zhang, Zexuan; Wang, Runsheng; Jiang, Xiaobo; Guo, Shaofeng; Wang, Yangyuan; Wang, Xingsheng; Cheng, Binjie; Asenov, Asen; Huang, Ru
收藏  |  浏览/下载:4/0  |  提交时间:2017/12/03
Investigation on the Amplitude of Random Telegraph Noise(RTN) in Nanoscale MOSFETs——Scaling Limit of “Hole in the Inversion Layer” Model 其他
2016-01-01
Zexuan Zhang; Zhe Zhang; Shaofeng Guo; Runsheng Wang; Xingsheng Wang; Binjie Cheng; Ru Huang
收藏  |  浏览/下载:3/0  |  提交时间:2017/12/03
Variation-aware energy-delay optimization method for device/circuit co-design 其他
2015-01-01
Wang, Junyao; Jiang, Xiaobo; Wang, Xingsheng; Wang, Runsheng; Cheng, Binjie; Asenov, Asen; Wei, Lan; Huang, Ru
收藏  |  浏览/下载:4/0  |  提交时间:2017/12/03
VARIATION-AWARE ENERGY-DELAY OPTIMIZATION METHOD FOR DEVICE/CIRCUIT CO-DESIGN 其他
2015-01-01
Wang, Junyao; Jiang, Xiaobo; Wang, Xingsheng; Wang, Runsheng; Cheng, Binjie; Asenov, Asen; Wei, Lan; Huang, Ru
收藏  |  浏览/下载:3/0  |  提交时间:2017/12/03
Predictive Compact Modeling of Random Variations in FinFET Technology for 16/14nm Node and Beyond 其他
2015-01-01
Jiang, Xiaobo; Wang, Xingsheng; Wang, Runsheng; Cheng, Binjie; Asenov, Asen; Huang, Ru
收藏  |  浏览/下载:5/0  |  提交时间:2017/12/03


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