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Low-frequency Testing of Through Silicon Vias for Defect Diagnosis in Three-dimensional Integration Circuit Stacking Technology (CPCI-S收录) 会议论文
2014 IEEE 64TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC)
作者:  Xu, Yichao[1,3];  Miao, Min[1,2];  Fang, Runiu[1];  Sun, Xin[1];  Zhu, Yunhui[1]
收藏  |  浏览/下载:0/0  |  提交时间:2019/04/12
Investigation of a TSV-RDL In-line Fault-Diagnosis System and Test Methodology for Wafer-level Commercial Production (CPCI-S收录) 会议论文
2014 IEEE 64TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC)
作者:  Fang, Runiu[1];  Miao, Min[2];  Sun, Xin[1];  Zhu, Yunhui[1];  Wang, Guanjiang[3]
收藏  |  浏览/下载:3/0  |  提交时间:2019/04/12
Effect of hot-water extraction on alkaline pulping of bagasse (CPCI-S收录) 会议论文
BIOTECHNOLOGY ADVANCES
作者:  Lei, Yichao[1];  Liu, Shijie[1,2];  Li, Jiang[1];  Sun, Runcang[1]
收藏  |  浏览/下载:0/0  |  提交时间:2019/04/16


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