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科研机构
北京大学 [38]
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期刊论文 [19]
其他 [18]
会议论文 [1]
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2017 [1]
2016 [10]
2015 [8]
2014 [6]
2013 [3]
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专题:北京大学
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The Impact of Self-Heating on HCI Reliability in High-Performance Digital Circuits
期刊论文
IEEE ELECTRON DEVICE LETTERS, 2017
Jiang, Hai
;
Shin, SangHoon
;
Liu, Xiaoyan
;
Zhang, Xing
;
Alam, Muhammad Ashraful
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2017/12/03
Self-heating
digital circuits
hot carrier injection
reliability
lifetime
MOSFETS
Rice bulliform phytoliths reveal the process of rice domestication in the Neolithic Lower Yangtze River region
会议论文
Ma, Yongchao
;
Yang, Xiaoyan
;
Huan, Xiujia
;
Wang, Weiwei
;
Ma, Zhikun
;
Li, Zhao
;
Sun, Guoping
;
Jiang, Leping
;
Zhuang, Yijie
;
Lu, Houyuan
收藏
  |  
浏览/下载:12/0
  |  
提交时间:2017/12/03
Phytolith analysis
Origins of agriculture
Plant remains
Archaeobotanical data
China
SILICA BODY
EAST CHINA
CARBONIZATION
CULTIVATION
JAPONICA
INDICA
WILD
Rice bulliform phytoliths reveal the process of rice domestication in the Neolithic Lower Yangtze River region
期刊论文
Nagoya International Quaternary Science Meeting, 2016
Ma, Yongchao
;
Yang, Xiaoyan
;
Huan, Xiujia
;
Wang, Weiwei
;
Ma, Zhikun
;
Li, Zhao
;
Sun, Guoping
;
Jiang, Leping
;
Zhuang, Yijie
;
Lu, Houyuan
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2017/12/03
Phytolith analysis
Origins of agriculture
Plant remains
Archaeobotanical data
China
SILICA BODY
EAST CHINA
CARBONIZATION
CULTIVATION
JAPONICA
INDICA
WILD
Disturbance characteristics of half-selected cells in a cross-point resistive switching memory array
期刊论文
NANOTECHNOLOGY, 2016
Chen, Zhe
;
Li, Haitong
;
Chen, Hong-Yu
;
Chen, Bing
;
Liu, Rui
;
Huang, Peng
;
Zhang, Feifei
;
Jiang, Zizhen
;
Ye, Hongfei
;
Gao, Bin
;
Liu, Lifeng
;
Liu, Xiaoyan
;
Kang, Jinfeng
;
Wong, H-S Philip
;
Yu, Shimeng
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2017/12/03
resistance disturbance
resistive random access memory (RRAM)
half-selected (HS) cells
cross-point array
SPICE simulation
RRAM
MODEL
DEVICE
Reliability investigation of high-k/metal gate in nMOSFETs by three-dimensional kinetic Monte-Carlo simulation with multiple trap interactions
其他
2016-01-01
Li, Yun
;
Jiang, Hai
;
Lun, Zhiyuan
;
Wang, Yijiao
;
Huang, Peng
;
Hao, Hao
;
Du, Gang
;
Zhang, Xing
;
Liu, Xiaoyan
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2017/12/03
OXIDE
MODEL
BIAS
DEGRADATION
TECHNOLOGY
DEFECTS
STACKS
NOISE
PBTI
HFO2
Investigation of local heating effect for 14nm Ge pFinFETs based on Monte Carlo method
其他
2016-01-01
Yin, Longxiang
;
Jiang, Hai
;
Shen, Lei
;
Wang, Juncheng
;
Du, Gang
;
Liu, Xiaoyan
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2017/12/03
Reliability investigation of high-k/metal gate in nMOSFETs by three-dimensional kinetic Monte-Carlo simulation with multiple trap interactions
期刊论文
International Conference on Solid State Devices and Materials (SSDM), 2016
Li, Yun
;
Jiang, Hai
;
Lun, Zhiyuan
;
Wang, Yijiao
;
Huang, Peng
;
Hao, Hao
;
Du, Gang
;
Zhang, Xing
;
Liu, Xiaoyan
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2017/12/03
OXIDE
MODEL
BIAS
DEGRADATION
TECHNOLOGY
DEFECTS
STACKS
NOISE
PBTI
HFO2
Evaulation the Degradation in nMOSFETs with HfO2 Gate Dielectric and Interfacial Layer by 3D Kinetic Monte-Carlo Method
其他
2016-01-01
Li, Yun
;
Lun, Zhiyuan
;
Wang, Yijiao
;
Huang, Peng
;
Jiang, Hai
;
Zhang, Xing
;
Du, Gang
;
Liu, Xiaoyan
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2017/12/03
Characterization of Self-heating Leads to Universal Scaling of HCI Degradation of Multi-Fin SOI FinFETs
其他
2016-01-01
Jiang, Hai
;
Shin, SangHoon
;
Liu, Xiaoyan
;
Zhang, Xing
;
Alam, Muhammad Ashraful
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2017/12/03
Self-heating
Hot carrier injection
Thermal circuit model
universal degradation
Gate-all-around transistors
HOT-CARRIER DEGRADATION
SHORT-CHANNEL TRANSISTORS
TRANSPORT
MOSFETS
DEVICES
NBTI
Performance Evaluation and Optimization of Single Layer MoS2 Double Gate Transistors with metallic contacts
其他
2016-01-01
Zeng, Lang
;
Gong, Fanghui
;
Nan, Jiang
;
Huang, Yangqi
;
Zhang, He
;
Liu, Xiaoyan
;
Zhang, Youguang
;
Zhao, Weisheng
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2017/12/03
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