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浏览/检索结果: 共6条，第1-6条 帮助 限定条件 内容类型：其他     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择发表日期升序发表日期降序提交时间升序提交时间降序题名升序题名降序作者升序作者降序 New insights into the design for end-of-life variability of NBTI in scaled high-��/metal-gate Technology for the nano-reliability era 其他 2015-01-01 Ren, Pengpeng; Wang, Runsheng; Ji, Zhigang; Hao, Peng; Jiang, Xiaobo; Guo, Shaofeng; Luo, Mulong; Duan, Meng; Zhang, Jian F.; Wang, Jianping; Liu, Jinhua; Bu, Weihai; Wu, Jingang; Wong, Waisum; Yu, Shaofeng; Wu, Hanming; Lee, Shiuh-Wuu; Xu, Nuo; Huang, Ru 收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03 New understanding of state-loss in complex RTN: Statistical experimental study, trap interaction models, and impact on circuits 其他 2015-01-01 Zou, Jibin; Wang, Runsheng; Guo, Shaofeng; Luo, Mulong; Yu, Zhuoqing; Jiang, Xiaobo; Ren, Pengpeng; Wang, Jianping; Liu, Jinhua; Wu, Jingang; Wong, Waisum; Yu, Shaofeng; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan; Huang, Ru 收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03 DTMOS mode as an effective solution of RTN suppression for robust device/circuit co-design 其他 2015-01-01 Guo, Shaofeng; Huang, Ru; Hao, Peng; Luo, Mulong; Ren, Pengpeng; Wang, Jianping; Bu, Weihai; Wu, Jingang; Wong, Waisum; Yu, Scott; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Runsheng; Wang, Yangyuan 收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03 New Observations on Complex RTN in Scaled High-kappa/Metal-gate MOSFETs - the Role of Defect Coupling under DC/AC Condition 其他 2013-01-01 Ren, Pengpeng; Hao, Peng; Liu, Changze; Wang, Runsheng; Jiang, Xiaobo; Qin, Yingxin; Huang, Ru; Guo, Shaofeng; Luo, Mulong; Zou, Jibin; Li, Meng; Wang, Jianping; Wu, Jingang; Liu, Jinhua; Bu, Weihai; Wong, Waisum; Yu, Scott; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan 收藏  |  浏览/下载：3/0  |  提交时间：2015/11/13 A Unified Approach for Trap-Aware Device/Circuit Co-Design in Nanoscale CMOS Technology 其他 2013-01-01 Wang, Runsheng; Luo, Mulong; Guo, Shaofeng; Huang, Ru; Liu, Changze; Zou, Jibin; Wang, Jianping; Wu, Jingang; Xu, Nuo; Wong, Waisum; Yu, Scott; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan 收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13 NOISE   New observations on complex RTN in scaled high-��/metal-gate MOSFETs - The role of defect coupling under DC/AC condition 其他 2013-01-01 Ren, Pengpeng; Hao, Peng; Liu, Changze; Wang, Runsheng; Jiang, Xiaobo; Qiu, Yingxin; Huang, Ru; Guo, Shaofeng; Luo, Mulong; Zou, Jibin; Li, Meng; Wang, Jianping; Wu, Jingang; Liu, Jinhua; Bu, Weihai; Wong, Waisum; Yu, Scott; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan 收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13