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浏览/检索结果: 共10条，第1-10条 帮助 限定条件 专题：北京大学    第一署名单位    第一作者单位    通讯作者单位     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择发表日期升序发表日期降序提交时间升序提交时间降序题名升序题名降序作者升序作者降序 ESD Reliability Improvement of the 0.25-mu m 60-V Power nLDMOS with Discrete Embedded SCRs Separated by STI Structures 其他 2016-01-01 Chen, Shen-Li; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun; Chen, Hung-Wei 收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03 Electrostatic discharge (ESD)  N-channel lateral-diffused MOSFET (nLDMOS)  Secondary breakdown current (I-t2)  Shallow-trench isolation (STI)  Silicon-controller rectifier (SCR)   ESD Reliability Evaluations of the 60-V nLDMOS by the Drain-side Discrete SCRs 其他 2016-01-01 Chen, Shen-Li; Chen, Kuei-Jyun; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying 收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03 LDMOS   Design on ESD Robustness of Source-side Discrete Distribution in the 60-V High-Voltage nLDMOS Devices 其他 2016-01-01 Chen, Shen-Li; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun; Wu, Yi-Cih; Lin, Jia-Ming 收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03 LDMOS   ESD reliability improvement of the 0.25-��m 60-V power nLDMOS with discrete embedded SCRs separated by STI structures 其他 2016-01-01 Chen, Shen-Li; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun; Chen, Hung-Wei 收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03 ESD-reliability characterizations of a 45-V p-channel LDMOS-SCR with the discrete-cathode end 其他 2016-01-01 Chen, Shen-Li; Huang, Yu-Ting; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun 收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03 Design on ESD robustness of source-side discrete distribution in the 60-V high-voltage nLDMOS devices 其他 2016-01-01 Chen, Shen-Li; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun; Wu, Yi-Cih; Lin, Jia-Ming 收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03 ESD reliability evaluations of the 60-V nLDMOS by the drain-side discrete SCRs 其他 2016-01-01 Chen, Shen-Li; Chen, Kuei-Jyun; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying 收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03 ESD-Reliability Characterizations of a 45-V p-Channel LDMOS-SCR with the Discrete-Cathode End 其他 2016-01-01 Chen, Shen-Li; Huang, Yu-Ting; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun 收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03 P-type laterally-diffused metal oxide semiconductor (pLDMOS)  Electrostatic Discharge (ESD)  Holding voltage (V-h)  Secondary breakdown current (I-t2)   FSD Protection Design for the 45-V pLDMOS-SCR (p-n-p-Arranged) Devices with Source-Discrete Distributions 其他 2016-01-01 Chen, Shen-Li; Huang, Yu-Ting; Yen, Chih-Ying; Chen, Kuei-Jyun; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung 收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03 Electrostatic-discharge (ESD)  Holding voltage (V-h)  p-channel lateral-diffused MOSFET (pLDMOS)  Secondary breakdown-current (I-1/2)  Silicon controlled rectifier (SCR)  Trigger Voltage (V-t1)   Synthesis and electroactive properties of poly(amidoamine) dendrimers with an aniline pentamer shell 期刊论文 材料化学杂志, 2011 Hung, Wei-I; Hung, Chih-Bing; Chang, Ya-Han; Dai, Jiun-Kuang; Li, Yan; He, Hai; Chen, Shao-Wen; Huang, Tsao-Cheng; Wei, Yen; Jia, Xin-Ru; Yeh, Jui-Ming 收藏  |  浏览/下载：2/0  |  提交时间：2015/11/12 TRANSPORT-PROPERTIES  POLYANILINE  POLYMERIZATION  POLYMERS  ELECTRORHEOLOGY  POLYAMIDOAMINE  COMPLEXES  COPOLYMER  OXIDATION  SALT