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浏览/检索结果: 共3条，第1-3条 帮助 限定条件 发表日期：2018     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择发表日期升序发表日期降序提交时间升序提交时间降序题名升序题名降序作者升序作者降序 Estimation of low-dose-rate degradation on bipolar linear circuits using different accelerated evaluation methods 期刊论文 ACTA PHYSICA SINICA, 2018, 卷号: 67, 期号: 9, 页码: 202-209 作者:  Li, XL (Li Xiao-Long)[ 1,2,3 ];  Lu, W (Lu Wu)[ 1,2 ];  Wang, X (Wang Xin)[ 1,2,3 ];  Guo, Q (Guo Qi)[ 1,2 ];  He, CF (He Cheng-Fa)[ 1,2 ] 收藏  |  浏览/下载：35/0  |  提交时间：2018/09/27 Bipolar Circuit  Enhanced Low-dose-rate Sensitivity  Accelerated Evaluation Method   Simulation of Synergism Effect Using Temperature Switching Irradiation on Bipolar Comparator 期刊论文 CHINESE PHYSICS LETTERS, 2018, 卷号: 35, 期号: 8, 页码: 1-4 作者:  Yu, X (Yu, Xin)[ 1,2 ];  Lu, W (Lu, Wu)[ 1,2 ];  Yao, S (Yao, Shuai)[ 1,2,3 ];  Guo, Q (Guo, Qi)[ 1,2 ];  Sun, J (Sun, Jing)[ 1,2 ] 收藏  |  浏览/下载：45/0  |  提交时间：2018/10/19 The Increased Single-Event Upset Sensitivity of 65-nm DICE SRAM Induced by Total Ionizing Dose 期刊论文 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018, 卷号: 65, 期号: 8, 页码: 1920-1927 作者:  Zheng, QW (Zheng, Qiwen)[ 1 ];  Cui, JW (Cui, Jiangwei)[ 1 ];  Lu, W (Lu, Wu)[ 1 ];  Guo, HX (Guo, Hongxia)[ 1 ];  Liu, J (Liu, Jie)[ 2 ] 收藏  |  浏览/下载：53/0  |  提交时间：2018/09/27 Charge Sharing  Single-event Upset (Seu)  Static Random Access Memory  Total Ionizing Dose (Tid)