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Electrical Measurement and Analysis of TSV/RDL for 3D Integration (CPCI-S收录) 会议论文
2014 IEEE 16TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE (EPTC)
作者:  Sun, Xin[1];  Fang, Runiu[1];  Zhu, Yunhui[1];  Zhong, Xiao[1];  Bian, Yuan[1]
收藏  |  浏览/下载:2/0  |  提交时间:2019/04/12
A TSV Last Integration Approach with Wafer Level Pre-patterned Adhesive Bonding (CPCI-S收录) 会议论文
2012 4TH ELECTRONIC SYSTEM-INTEGRATION TECHNOLOGY CONFERENCE (ESTC)
作者:  Zhu, Yunhui[1];  Ma, Shenglin[1];  Sun, Xin[1];  Cui, Qinghu[2];  Zhong, Xiao[1]
收藏  |  浏览/下载:3/0  |  提交时间:2019/04/15
Understanding Effect of Additives in Copper Electroplating Filling for Through Silicon Via (CPCI-S收录) 会议论文
2012 IEEE 11TH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY (ICSICT-2012)
作者:  Miao, Min[1,2];  Zhu, Yunhui[1];  Bian, Yuan[1];  Sun, Xin[1];  Ma, Shenglin[1]
收藏  |  浏览/下载:2/0  |  提交时间:2019/04/15


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