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Characterization of periodicity fluctuations in ingan/gan mqws by the kinematical simulation of x-ray diffraction 期刊论文
Applied physics express, 2019, 卷号: 12, 期号: 4
作者:  Li,Yangfeng;  Die,Junhui;  Yan,Shen;  Deng,Zhen;  Ma,Ziguang
收藏  |  浏览/下载:107/0  |  提交时间:2019/05/09
The substantial dislocation reduction by preferentially passivating etched defect pits in gan epitaxial growth 期刊论文
Applied physics express, 2019, 卷号: 12, 期号: 3
作者:  Hu,Wei;  Die,Junhui;  Wang,Caiwei;  Yan,Shen;  Hu,Xiaotao
收藏  |  浏览/下载:144/0  |  提交时间:2019/05/09


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