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The thermal stability study and improvement of 4H-SiC ohmic contact 期刊论文
applied physics letters, 2014, 卷号: 105, 期号: 12, 页码: 122106
Liu, SB; He, Z; Zheng, L; Liu, B; Zhang, F; Dong, L; Tian, LX; Shen, ZW; Wang, JZ; Huang, YJ; Fan, ZC; Liu, XF; Yan, GG; Zhao, WS; Wang, L; Sun, GS; Yang, FH; Zeng, YP
收藏  |  浏览/下载:19/0  |  提交时间:2015/03/20
Slowing Down DNA Translocation Through Solid-State Nanopores by Pressure 期刊论文
small, 2013, 卷号: 9, 期号: 24, 页码: 4112-4117
Hengbin Zhang; Qing Zhao; Zhipeng Tang; Song Liu; Qingtao Li; Zhongchao Fan; Fuhua Yang; Liping You; Xuemei Li; Jingmin Zhang; Dapeng Yu
收藏  |  浏览/下载:15/0  |  提交时间:2015/04/02
Effect of the technology of implanting nitrogen into buried oxide on the radiation hardness of the top gate oxide for partially depleted SOIPMOSFET 期刊论文
chinese physics, 2005, 卷号: 14, 期号: 3, 页码: 565-570
Zheng ZS; Liu ZL; Zhang GQ; Li N; Fan K; Zhang EX; Yi WB; Chen M; Wang X
收藏  |  浏览/下载:24/0  |  提交时间:2010/03/17
Effects of techniques of implanting nitrogen into buried oxide on the characteristics of partially depleted SOIPMOSFET 期刊论文
chinese physics letters, 2005, 卷号: 22, 期号: 3, 页码: 654-656
Zheng ZS; Liu ZL; Zhang GQ; Li N; Fan K; Zhang EX; Yi WB; Chen M; Wang X
收藏  |  浏览/下载:108/0  |  提交时间:2010/03/17
Effects of the technology of implanting nitrogen into buried oxide layer on the characteristics of partially depleted SOI nMOSFET 期刊论文
acta physica sinica, 2005, 卷号: 54, 期号: 1, 页码: 348-353
Zheng ZS; Liu ZL; Zhang GQ; Li N; Fan K; Zhang EX; Yi WB; Chen M; Wang X
收藏  |  浏览/下载:33/0  |  提交时间:2010/03/17
SOI  
一个实用的部分耗尽SOI器件体接触仿真模型 期刊论文
微电子学, 2005, 卷号: 35, 期号: 2, 页码: 138-141
姜凡; 尹雪松; 刘忠立
收藏  |  浏览/下载:101/1  |  提交时间:2010/11/23
部分耗尽型SOI CMOS模拟电路设计研究 期刊论文
半导体技术, 2005, 卷号: 30, 期号: 4, 页码: 54-57
尹雪松; 姜凡; 刘忠立
收藏  |  浏览/下载:9/0  |  提交时间:2010/11/23
部分耗尽SOI静态存储器位线电路的研究 期刊论文
微电子学, 2005, 卷号: 35, 期号: 3, 页码: 297-300
姜凡; 刘忠立
收藏  |  浏览/下载:9/0  |  提交时间:2010/11/23
Radiation response of partially-depleted MOS transistors fabricated in the fluorinated SIMOX wafers 会议论文
7th international conference on solid-state and integrated circuits technology, beijing, peoples r china, oct 18-21, 2004
Li, N; Zhang, GQ; Liu, ZL; Fan, K; Zheng, ZS; Lin, Q; Zhang, ZX; Lin, CL
收藏  |  浏览/下载:127/22  |  提交时间:2010/03/29
Effect of the implantation of fluorine on the mobility of channel electron for partially depleted SOI nMOSFET 会议论文
7th international conference on solid-state and integrated circuits technology, beijing, peoples r china, oct 18-21, 2004
Zheng, ZS; Liu, ZL; Zhang, GQ; Li, N; Fan, K
收藏  |  浏览/下载:167/30  |  提交时间:2010/03/29


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