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科研机构
北京航空航天大学 [177]
内容类型
会议论文 [97]
期刊论文 [80]
发表日期
2019 [24]
2018 [35]
2017 [34]
2016 [17]
2015 [23]
2014 [18]
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专题:北京航空航天大学
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Degradation analysis based on an extended inverse Gaussian process model with skew-normal random effects and measurement errors
期刊论文
RELIABILITY ENGINEERING & SYSTEM SAFETY, 2019, 卷号: 189, 页码: 261-270
作者:
Hao Songhua
;
Jun, Yang
;
Berenguer, Christophe
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2019/12/30
Extended inverse Gaussian process model
Skew-normal random effects
Measurement errors
The MLE method
Extended MC integration algorithm
Degradation state mining and identification for railway point machines
期刊论文
RELIABILITY ENGINEERING & SYSTEM SAFETY, 2019, 卷号: 188, 页码: 432-443
作者:
Bian, Chong
;
Yang, Shunkun
;
Huang, Tingting
;
Xu, Qingyang
;
Liu, Jie
收藏
  |  
浏览/下载:49/0
  |  
提交时间:2019/12/30
Degradation state mining
Degradation state identification
Early fault diagnosis
Railway point machine
Self-organizing mapping
Support vector machine
ACCELERATED DEGRADATION ANALYSIS BASED ON A RANDOM-EFFECT WIENER PROCESS WITH ONE-ORDER AUTOREGRESSIVE ERRORS
期刊论文
EKSPLOATACJA I NIEZAWODNOSC-MAINTENANCE AND RELIABILITY, 2019, 卷号: 21, 页码: 246-255
作者:
Li, Junxing
;
Wang, Zhihua
;
Liu, Chengrui
;
Qiu, Ming
收藏
  |  
浏览/下载:7/0
  |  
提交时间:2019/12/30
reliability evaluation
accelerated degradation modeling
Wiener process
unit-to-unit variability
measurement errors
A Sequential Bayesian Approach for Remaining Useful Life Prediction of Dependent Competing Failure Processes
期刊论文
IEEE TRANSACTIONS ON RELIABILITY, 2019, 卷号: 68, 页码: 317-329
作者:
Fan, Mengfei
;
Zeng, Zhiguo
;
Zio, Enrico
;
Kang, Rui
;
Chen, Ying
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2019/12/30
Degradation
dependent competing failure processes
Markov chain Monte Carlo
particle filtering
prognostics
random shocks
remaining useful life
Reliability-oriented design of integrated model of preventive maintenance and quality control policy with time-between-events control chart
期刊论文
COMPUTERS & INDUSTRIAL ENGINEERING, 2019, 卷号: 129, 页码: 228-238
作者:
He, Yihai
;
Liu, Fengdi
;
Cui, Jiaming
;
Han, Xiao
;
Zhao, Yixiao
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2019/12/30
Manufacturing process
Reliability degradation
Quality control
Preventive maintenance
Joint optimization model
Time-dependent Reliability Modelling Method Based on Load-strength Model in the Presence of Environmental Effects
会议论文
IEEE International Conference on Industrial Engineering and Engineering Management, 2018-12-16
作者:
Zhang, J.-C.
;
Zhao, Y.
;
Ma, X.-B.
收藏
  |  
浏览/下载:7/0
  |  
提交时间:2019/12/30
Correlation methods
Numerical methods
Structural analysis
Copula
Correlation analysis
Environmental analysis
Environmental distribution
Reliability estimation
Strength degradation
Structural performance
Time dependent reliability
Reliability analysis
A modified reliability model for lithium-ion battery packs based on the stochastic capacity degradation and dynamic response impedance
期刊论文
JOURNAL OF POWER SOURCES, 2019, 卷号: 423, 页码: 40-51
作者:
Xia, Quan
;
Wang, Zili
;
Ren, Yi
;
Tao, Laifa
;
Lu, Chen
收藏
  |  
浏览/下载:8/0
  |  
提交时间:2019/12/30
Battery pack
Reliability
Stochastic capacity degradation
Dynamic response impedance
Multi-physics
Electric vehicle
Remaining useful life prediction of aviation circular electrical connectors using vibration-induced physical model and particle filtering method
期刊论文
MICROELECTRONICS RELIABILITY, 2019, 卷号: 92, 页码: 114-122
作者:
Sun, Bo
;
Li, Yu
;
Wang, Zili
;
Ren, Yi
;
Feng, Qiang
收藏
  |  
浏览/下载:10/0
  |  
提交时间:2019/12/30
Electric connectors
Failure (mechanical)
Failure analysis
Manufacture
Monte Carlo methods
Oxide films
Accelerated degradation testing (ADT)
Data-driven methods
Electrical connectors
Engineering practices
Manufacturing process
Particle filtering methods
Prediction methods
Remaining useful life predictions
Forecasting
Addressing Failure and Aging Degradation in MRAM/MeRAM-on-FDSOI Integration
期刊论文
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2019, 卷号: 66, 页码: 239-250
作者:
Cai, Hao
;
Wang, You
;
Naviner, Lirida Alves de Barros
;
Liu, Xinning
;
Shan, Weiwei
收藏
  |  
浏览/下载:7/0
  |  
提交时间:2019/12/30
Fully depleted silicon-on-insulator (FDSOI)
magnetic tunnel junction (MTJ)
spin transfer torque magnetic random access memory (STT-MRAM)
voltage-controlled magnetic anisotropy (VCMA)
magnetoelectric random access memory (MeRAM)
aging
reliability
variability
Risk-oriented assembly quality analysing approach considering product reliability degradation
期刊论文
INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH, 2019, 卷号: 57, 页码: 271-284
作者:
He, Yihai
;
Cui, Jiaming
;
Liu, Fengdi
;
Duan, Panting
;
Li, Donglin
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2019/12/30
assembly process
quality analysis
product reliability degradation
accident risk assessment
QRR chain
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