CORC

浏览/检索结果: 共4条,第1-4条 帮助

限定条件    
已选(0)清除 条数/页:   排序方式:
Comparative studies of Ge and Si p-channel metal-oxide-semiconductor field-effect-transistors with HfSiON dielectric and TaN metal gate 外文期刊
2010
作者:  Xu, QX;  Hu, AB
收藏  |  浏览/下载:15/0  |  提交时间:2010/11/26
Finite-element study of strain field in strained-Si MOSFET 外文期刊
2009
作者:  Liu, HH;  Xu, QX;  Duan, XF
收藏  |  浏览/下载:17/0  |  提交时间:2010/11/26
Study of strained-silicon channel metal-oxide-semiconductor field effect transistors by large angle convergent-beam electron diffraction 外文期刊
2008
作者:  Liu, HH;  Duan, XF;  Xu, QX;  Liu, BG
收藏  |  浏览/下载:13/0  |  提交时间:2010/11/26
Nanoscale strain analysis of strained-Si metal-oxide-semiconductor field effect transistors by large angle convergent-beam electron diffraction 外文期刊
2006
作者:  Liu, HH;  Duan, XF;  Qi, XY;  Xu, QX;  Li, HO
收藏  |  浏览/下载:15/0  |  提交时间:2010/11/26


©版权所有 ©2017 CSpace - Powered by CSpace